H01J 2203/024
Focusing electrodes
H01J2203/024 (Focusing electrodes) appears on 5 US grants and 6 published applications in this corpus.
Search patents in H01J- Granted patents
- 5
- Published applications
- 6
- Assignees
- 4
- Inventors
- 17
- Latest grant
- 25 Jan 2022
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| Year | Granted patents | Published applications |
|---|---|---|
| 2006 | 0 | 1 |
| 2007 | 0 | 2 |
| 2008 | 1 | 0 |
| 2009 | 0 | 0 |
| 2010 | 1 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 1 |
| 2013 | 0 | 1 |
| 2014 | 0 | 0 |
| 2015 | 1 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 1 | 0 |
| 2021 | 0 | 1 |
| 2022 | 1 | 0 |
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Granted patents
Recent patents
- Method of operating a charged particle gun, charged particle gun, and charged particle beam device25 Jan 2022US 11,232,924 B2ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Method of operating a charged particle gun, charged particle gun, and charged particle beam device8 Dec 2020US 10,861,666 B1ICT Integrated Circuit Testing Gesellschaft für Halbletterprüftechnik mbH
- Electron emission device and X-ray generator including the same23 Jun 2015US 9,064,670 B2Samsung Electronics Co., Ltd.
- Electron emission device and electron emission display using the same26 Jan 2010US 7,652,419 B2Samsung SDI.Co., Ltd.
- Electron emission device27 May 2008US 7,378,789 B2Samsung SDI.Co., Ltd.
- Method of operating a charged particle gun, charged particle gun, and charged particle beam device5 Aug 2021US 2021/0241990 A1ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Electron emission device and x-ray generator including the same5 Sep 2013US 2013/0230146 A1Samsung Electronics Co., Ltd.
- Electron beam source system and method6 Sep 2012US 2012/0223245 A1
- Electron emission device and electron emission display using the same23 Aug 2007US 2007/0194689 A1Samsung SDI.Co., Ltd.
- Electron emission device having a focus electrode and a fabrication method therefor8 Feb 2007US 2007/0029919 A1
Most cited
By later US patents
- Electron emission device and X-ray generator including the same4US 9,064,670 B2Samsung Electronics Co., Ltd. · 2015
- Method of operating a charged particle gun, charged particle gun, and charged particle beam device2US 10,861,666 B1ICT Integrated Circuit Testing Gesellschaft für Halbletterprüftechnik mbH · 2020
- Electron emission device1US 7,378,789 B2Samsung SDI.Co., Ltd. · 2008