G21K 2201/062
The element being a crystal
Official title: the element being a crystal
G21K2201/062 (The element being a crystal) appears on 141 US grants and 105 published applications in this corpus.
Search patents in G21K- Granted patents
- 141
- Published applications
- 105
- Assignees
- 85
- Inventors
- 295
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 3 | 0 |
| 1981 | 1 | 0 |
| 1982 | 3 | 0 |
| 1983 | 0 | 0 |
| 1984 | 4 | 0 |
| 1985 | 2 | 0 |
| 1986 | 3 | 0 |
| 1987 | 1 | 0 |
| 1988 | 5 | 0 |
| 1989 | 3 | 0 |
| 1990 | 0 | 0 |
| 1991 | 4 | 0 |
| 1992 | 3 | 0 |
| 1993 | 2 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 2 | 0 |
| 1997 | 0 | 0 |
| 1998 | 4 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 3 |
| 2002 | 3 | 0 |
| 2003 | 2 | 1 |
| 2004 | 0 | 0 |
| 2005 | 0 | 5 |
| 2006 | 2 | 3 |
| 2007 | 4 | 2 |
| 2008 | 3 | 7 |
| 2009 | 4 | 4 |
| 2010 | 6 | 8 |
| 2011 | 5 | 6 |
| 2012 | 5 | 4 |
| 2013 | 6 | 6 |
| 2014 | 2 | 4 |
| 2015 | 5 | 4 |
| 2016 | 7 | 5 |
| 2017 | 4 | 2 |
| 2018 | 3 | 3 |
| 2019 | 3 | 5 |
| 2020 | 4 | 4 |
| 2021 | 5 | 9 |
| 2022 | 7 | 9 |
| 2023 | 9 | 4 |
| 2024 | 5 | 3 |
| 2025 | 2 | 1 |
| 2026 | 2 | 3 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- X-ray scattering apparatus and x-ray scattering method25 Aug 2026US 12,716,855 B2Xenocs SAS
- X-ray irradiation apparatus, including a spectrally shaping X-ray optic and a spectral filter aperture device, for X-ray imaging2 Jun 2026US 12,646,634 B2Universitaet Hamburg
- Polarized, energy dispersive x-ray fluorescence system and method11 Mar 2025US 12,247,934 B2X-Ray Optical Systems, Inc.
- Integrated X-ray optics design25 Feb 2025US 12,237,093 B2The Regents of the University of California
- System and method for bending crystal wafers for use in high resolution analyzers13 Aug 2024US 12,062,465 B2Uchicago Argonne, LLC
- X-ray focusing and wavelength selection13 Aug 2026US 2026/0237536 A1Nova Measuring Instruments Ltd.
- Control apparatus, kratzky block, control method and control program11 Jun 2026US 2026/0160715 A1Rigaku Corporation
- A high brightness primary x-ray source for in-line xps and xrf metrology9 Apr 2026US 2026/0098824 A1Nova Measuring Instruments Ltd.
- X-ray irradiation apparatus, including a spectrally shaping x-ray optic and a spectral filter aperture device, for x-ray imaging20 Feb 2025US 2025/0062048 A1Universitaet Hamburg
- X-ray scattering apparatus and x-ray scattering method25 Jul 2024US 2024/0248050 A1Xenocs SAS
Most cited
By later US patents
- Method of fabricating periodic monolayer semiconductor structures by molecular beam epitaxy74US 4,261,771 ABell Telephone Laboratories, Incorporated · 1981
- Rotation, acceleration, and gravity sensors using quantum-mechanical matter-wave interferometry with neutral atoms and molecules62US 4,992,656 A1991
- High brightness X-ray absorption spectroscopy system56US 9,448,190 B2Sigray, Inc. · 2016
- XRF system having multiple excitation energy bands in highly aligned package50US 8,559,597 B2X-Ray Optical Systems, Inc. · 2013
- X-ray spectrometer and apparatus for XAFS measurements49US 6,456,688 B1Rigaku Corporation · 2002