X-ray focusing and wavelength selection
AssigneeNova Measuring Instruments Ltd.
InventorsBruno W. SCHUELER, Guorong V. ZHUANG, Gildardo DELGADO
Life of this patent
Estimating the term…
Loading patent…
AssigneeNova Measuring Instruments Ltd.
InventorsBruno W. SCHUELER, Guorong V. ZHUANG, Gildardo DELGADO
Estimating the term…
X-ray optics that include (i) achromatic collimating optics that is adapted to collimate an input X-ray beam to provide a collimated X-ray beam; (ii) an adjustable diffraction unit that is adapted to (a) receive the collimated X-ray beam, while being configured according to a current configuration that is associated with a current wavelength selected out of different wavelengths, the current configuration is selected out of different configurations that are associated with the different wavelengths, and (b) filter the collimated X-ray beam to provide a filtered collimated X-ray beam of the current wavelength; and (iii) achromatic focusing optics that is configured to focus the filtered collimated X-ray beam to provide a focused filtered X-ray beam.
X-ray optics, comprising:
A method for manipulating an input X-ray beam, the method comprising:
20-30. (canceled)
Dependencies are inferred from the claim text.