US 6,456,688 B1 · X-ray spectrometer and apparatus for XAFS measurements

Abstract

An X-ray spectrometer having a curved crystal monochromator which diffracts a continuous X-ray beam from an X-ray source to produce a monochromatic X-ray beam. An angle of incidence of the continuous X-ray beam can be changed with respect to the monochromator so as to change the wavelength of the monochromatic X-ray beam which is focused on and taken out from a receiving slit. The X-ray source, the monochromator and the receiving slit must be positioned always on a Rowland circle. The X-ray source and the monochromator can be moved so that the angle of incidence changes, while the receiving slit remains always stationary and the direction of an X-ray path from the center of the monochromator to the receiving slit remains always constant. Such an X-ray spectrometer is usable as an X-ray irradiation system of XAFS (X-ray Absorption Fine Structure) apparatus so that XAFS measurements require no movement of the sample.

Claims7

Dependent claims

An X-ray spectrometer comprising:

an X-ray source;
a curved crystal monochromator;
a receiving slit;
and
a movement control mechanism in which an angle of incidence of a continuous X-ray beam from said X-ray source can be changed with respect to said monochromator so that a monochromatic X-ray beam of a different desired wavelength can be focused on and taken out from said receiving slit, provided that said X-ray source, said monochromator and said receiving slit must be positioned always on a Rowland circle, wherein
said X-ray source and said curved crystal monochromator can be moved so that said angle of incidence changes, while said receiving slit remains stationary and a direction of an X-ray path from the center of said curved crystal monochromator to said receiving slit remains always constant during a change of said angle of incidence.

3 more elements

Apparatus for XAFS measurements comprising:

an X-ray irradiation system consisting of an X-ray spectrometer which includes an X-ray source, a curved crystal monochromator, a receiving slit, and a movement control mechanism in which an angle of incidence of a continuous X-ray beam from said X-ray source can be changed with respect to said monochromator so that a monochromatic X-ray beam of a different desired wavelength can be focused on and taken out from said receiving slit, provided that said X-ray source, said monochromator and said receiving slit must be positioned always on a Rowland circle, wherein said X-ray source and said curved crystal monochromator can be moved so that said angle of incidence changes, while said receiving slit remains stationary and a direction of an X-ray path from the center of said curved crystal monochromator to said receiving slit remains always constant during a change of said angle of incidence;
and
an X-ray measurement system including a first X-ray detector for detecting an X-ray beam taken out from said X-ray irradiation system and a second X-ray detector for detecting (a) an X-ray beam having passed through said first X-ray detector and a sample or (b) a fluorescent X-ray beam generating from a sample.

Dependencies are inferred from the claim text.

X-ray spectrometer and apparatus for XAFS measurements

Life of this patent

X-ray spectrometer and apparatus for XAFS measurements

Life of this patent

Abstract

Claims7