G06T 2207/30121
Crt, lcd or plasma display
Official title: CRT, LCD or plasma display
G06T2207/30121 (Crt, lcd or plasma display) appears on 316 US grants and 367 published applications in this corpus.
Search patents in G06T- Granted patents
- 316
- Published applications
- 367
- Assignees
- 193
- Inventors
- 944
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 4 | 0 |
| 1999 | 5 | 0 |
| 2000 | 7 | 0 |
| 2001 | 3 | 5 |
| 2002 | 5 | 3 |
| 2003 | 1 | 2 |
| 2004 | 5 | 0 |
| 2005 | 1 | 1 |
| 2006 | 1 | 1 |
| 2007 | 0 | 0 |
| 2008 | 0 | 3 |
| 2009 | 0 | 6 |
| 2010 | 2 | 3 |
| 2011 | 1 | 3 |
| 2012 | 6 | 6 |
| 2013 | 3 | 3 |
| 2014 | 5 | 15 |
| 2015 | 6 | 9 |
| 2016 | 10 | 17 |
| 2017 | 16 | 17 |
| 2018 | 13 | 22 |
| 2019 | 24 | 41 |
| 2020 | 37 | 43 |
| 2021 | 35 | 32 |
| 2022 | 28 | 27 |
| 2023 | 17 | 33 |
| 2024 | 24 | 24 |
| 2025 | 29 | 30 |
| 2026 | 23 | 21 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Automatic optical inspection using hybrid imaging system6 Oct 2026US 12,755,370 B2Orbotech Ltd.
- Screen defect and contamination detection for mobile devices18 Aug 2026US 12,711,599 B2QUALCOMM Incorporated
- High-speed automatic film-foreign substance detection apparatus30 Jun 2026US 12,669,445 B2
- Image recognition method and system with improved accuracy of recognizing defect, and training method and an electronic device30 Jun 2026US 12,670,572 B2Beijing BOE Technology Development Co., Ltd.
- Detecting device component defects and generating corresponding recommendations using artificial intelligence techniques23 Jun 2026US 12,664,758 B2Dell Products L. P.
- System and method for employing adaptive pixel selector techniques for calculating color contrast ratio with dead pixel mitigation24 Sep 2026US 2026/0289835 A1Bank of America Corporation
- Methods and systems for detecting cracks in illuminated electronic device screens30 Jul 2026US 2026/0220761 A1ecoATM, LLC
- Computing parasitic values for semiconductor designs23 Jul 2026US 2026/0212102 A1D2S, Inc.
- Systems and methods for automatically grading pre-owned electronic devices23 Jul 2026US 2026/0212481 A1Assurant, Inc.
- Substrate processing method and apparatus2 Jul 2026US 2026/0185946 A1Semes Co., Ltd.
Most cited
By later US patents
- Method and apparatus for detecting defects in repeated microminiature patterns164US 4,845,558 AKLA Instruments Corporation · 1989
- Checking apparatus for flat type display panels114US 5,717,780 ASharp Kabushiki Kaisha · 1998
- Pattern inspection apparatus with corner rounding of reference pattern data104US 5,475,766 AKabushiki Kaisha Toshiba · 1995
- Pattern inspection apparatus, pattern inspection method, and recording medium87US 6,868,175 B1Nanogeometry Research · 2005
- Method and apparatus for incremental concurrent learning in automatic semiconductor wafer and liquid crystal display defect classification81US 6,148,099 ANeoPath, Inc. · 2000