G05B 2219/37519
From machining parameters classify different fault cases
G05B2219/37519 (From machining parameters classify different fault cases) appears on 8 US grants and 8 published applications in this corpus.
Search patents in G05B- Granted patents
- 8
- Published applications
- 8
- Assignees
- 8
- Inventors
- 25
- Latest grant
- 12 Jan 2021
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2002 | 1 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 1 | 1 |
| 2006 | 1 | 0 |
| 2007 | 1 | 0 |
| 2008 | 0 | 1 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 1 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 1 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 1 | 3 |
| 2020 | 1 | 0 |
| 2021 | 1 | 0 |
| 2022 | 0 | 0 |
| 2023 | 0 | 0 |
| 2024 | 0 | 0 |
| 2025 | 0 | 2 |
By publication year.
Recent patents
- Abnormality determination apparatus, non-transitory computer readable medium encoded with a program, abnormality determination system and abnormality determination method12 Jan 2021US 10,890,892 B2Fanuc Corporation
- System, method and computer program product for generating a training set for a classifier13 Oct 2020US 10,803,575 B2Applied Materials Israel Ltd.
- System, method and computer program product for generating a training set for a classifier23 Jul 2019US 10,360,669 B2Applied Materials Israel Ltd.
- Metrics independent and recipe independent fault classes30 Aug 2011US 8,010,321 B2APPLIED Materials.Inc.
- Method and apparatus for classifying faults based on wafer state data and sensor tool trace data2 Oct 2007US 7,277,824 B1Advanced Micro Devices, Inc.
- Anomaly determination method and production management system6 Mar 2025US 2025/0076858 A1Panasonic Intellectual Property Management Co., Ltd.
- Finding possible technical causes of or solutions for malfunctions of a production cell6 Feb 2025US 2025/0044777 A1Engel Austria GmbH
- System, method and computer program product for generating a training set for a classifier14 Nov 2019US 2019/0347785 A1Applied Materials Israel Ltd.
- Abnormality determination apparatus, non-transitory computer readable medium encoded with a program, abnormality determination system and abnormality determination method1 Aug 2019US 2019/0235472 A1Fanuc Corporation
- System, method and computer program product for generating a training set for a classifier28 Feb 2019US 2019/0066290 A1Applied Materials Israel Ltd.
Most cited
By later US patents
- System and method for real-time fault detection, classification, and correction in a semiconductor manufacturing environment39US 6,980,873 B2Taiwan Semiconductor Manufacturing Company.Ltd · 2005
- Defect reference system automatic pattern classification29US 6,466,895 B1APPLIED Materials.Inc. · 2002
- Metrics independent and recipe independent fault classes14US 8,010,321 B2APPLIED Materials.Inc. · 2011
- Method and apparatus for fault classification based on residual vectors10US 7,100,081 B1Advanced Micro Devices, Inc. · 2006
- Method and apparatus for classifying faults based on wafer state data and sensor tool trace data3US 7,277,824 B1Advanced Micro Devices, Inc. · 2007