G05B 2219/36405
Adjust path by detecting path, line with a photosensor
G05B2219/36405 (Adjust path by detecting path, line with a photosensor) appears on 13 US grants and 4 published applications in this corpus.
Search patents in G05B- Granted patents
- 13
- Published applications
- 4
- Assignees
- 8
- Inventors
- 32
- Latest grant
- 10 Feb 2004
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1994 | 2 | 0 |
| 1995 | 1 | 0 |
| 1996 | 4 | 0 |
| 1997 | 0 | 0 |
| 1998 | 3 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 1 |
| 2003 | 1 | 1 |
| 2004 | 1 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 1 |
| 2019 | 0 | 0 |
| 2020 | 0 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Apparatus and method for dispensing viscous liquid material10 Feb 2004US 6,689,219 B2
- Method and apparatus for determining substrate offset using optimization techniques30 Sep 2003US 6,629,053 B1Lam Research Corporation
- On the fly center-finding during substrate handling in a processing system6 Mar 2001US 6,198,976 B1APPLIED Materials.Inc.
- Method of detecting seam characteristic points18 Aug 1998US 5,796,610 AHonda Giken Kogyo Kabushiki Kaisha
- Wafer positioning system14 Apr 1998US 5,740,062 AAPPLIED Materials.Inc.
- Automatic Generation of Toolpaths9 Jul 2020US 2020/0218223 A1X Development LLC
- Automatic Generation of Toolpaths6 Dec 2018US 2018/0348730 A1X Development LLC
- Method for dispensing viscous liquid material17 Jul 2003US 2003/0134034 A1
- Apparatus and method for dispensing viscous liquid material19 Sep 2002US 2002/0132038 A1
Most cited
By later US patents
- Wafer positioning system140US 5,563,798 AAPPLIED Materials.Inc. · 1996
- System and method for automated positioning of a substrate in a processing chamber138US 5,483,138 AAPPLIED Materials.Inc. · 1996
- On the fly center-finding during substrate handling in a processing system87US 6,198,976 B1APPLIED Materials.Inc. · 2001
- Wafer positioning system69US 5,740,062 AAPPLIED Materials.Inc. · 1998
- Method and apparatus for determining substrate offset using optimization techniques48US 6,629,053 B1Lam Research Corporation · 2003