On the fly center-finding during substrate handling in a processing system
AssigneeApplied Materials, Inc.
InventorsSatish Sundar, Peter F. Ebbing
Life of this patent
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AssigneeApplied Materials, Inc.
InventorsSatish Sundar, Peter F. Ebbing
Estimating the term…
A substrate center-finding method and apparatus, for determining the center of a substrate being passed through a substrate handling chamber of a substrate processing system, includes any number of sensors arranged in any configuration and permits the substrate to pass through any trajectory that triggers the sensors. The locations of the sensors are calibrated by homing in on the sensors using a point, the reference point, near the tip of an arm assembly on a substrate handler. The substrate handler has an encoder for sensing the pivot angles of links in the arm assembly, whereby the coordinates of the reference point can be calculated from the angles and lengths of the links. When the substrate triggers a sensor, the location of the reference point is again calculated, and the coordinates of the trigger point on the edge of the substrate is determined relative to the reference point. A suitable number of trigger points on the edge of a circular substrate will define a circle, so the center of the circle can be calculated, and the location of the substrate can be adjusted to account for any offset from the reference point.
A method for handling a substrate in a processing system, comprising:
A substrate center-finding apparatus for a substrate processing system having a substrate handler for moving a substrate, the substrate center-finding apparatus comprising:
An apparatus for transferring a substrate in a processing system having a robot and at least on sensor disposed in the processing system, comprising:
Dependencies are inferred from the claim text.