G05B 2219/32191
Real time statistical process monitoring
G05B2219/32191 (Real time statistical process monitoring) appears on 98 US grants and 112 published applications in this corpus.
Search patents in G05B- Granted patents
- 98
- Published applications
- 112
- Assignees
- 86
- Inventors
- 351
- Latest grant
- 19 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1994 | 1 | 0 |
| 1995 | 2 | 0 |
| 1996 | 4 | 0 |
| 1997 | 4 | 0 |
| 1998 | 1 | 0 |
| 1999 | 2 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 3 | 3 |
| 2003 | 3 | 2 |
| 2004 | 6 | 3 |
| 2005 | 4 | 6 |
| 2006 | 5 | 5 |
| 2007 | 5 | 4 |
| 2008 | 1 | 3 |
| 2009 | 3 | 4 |
| 2010 | 3 | 4 |
| 2011 | 2 | 5 |
| 2012 | 1 | 2 |
| 2013 | 3 | 4 |
| 2014 | 3 | 0 |
| 2015 | 2 | 3 |
| 2016 | 1 | 4 |
| 2017 | 0 | 8 |
| 2018 | 4 | 10 |
| 2019 | 5 | 7 |
| 2020 | 8 | 5 |
| 2021 | 5 | 4 |
| 2022 | 1 | 13 |
| 2023 | 4 | 5 |
| 2024 | 3 | 1 |
| 2025 | 4 | 4 |
| 2026 | 4 | 3 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Data analysis device and method19 May 2026US 12,632,039 B2Panasonic Intellectual Property Management Co., Ltd.
- Method of determining at least one tolerance band limit value for a technical variable under test and corresponding calculation device24 Feb 2026US 12,560,919 B2Sanofi
- Distributed industrial performance monitoring and analytics platform10 Feb 2026US 12,547,160 B2Fisher-Rosemount Systems, Inc.
- Method for analysing quality deficiencies3 Feb 2026US 12,541,194 B2Dürr Systems AG
- Feedback control systems and methods for glass tube converting processes4 Nov 2025US 12,459,852 B2Corning Incorporated
- Information provision apparatus, information provision method, and information provision program27 Aug 2026US 2026/0252063 A1Yokogawa Electric Corporation
- Method for monitoring a production machine and monitoring device23 Apr 2026US 2026/0111019 A1Siemens Aktiengesellschaft
- Automatic recognition of an anomaly in a machine operation12 Feb 2026US 2026/0044144 A1Krones AG
- Information processing apparatus, information processing method, and storage medium16 Oct 2025US 2025/0321568 A1Tokyo Electron Limited
- Manufacturing system for electronic device7 Aug 2025US 2025/0251719 A1Innolux Corporation
Most cited
By later US patents
- Operator station for manufacturing process control system249US 5,631,825 ADow Benelux N.V. · 1997
- Process control method for improving manufacturing operations163US 5,440,478 AMercer Forge Company · 1995
- Method for setting and adjusting process parameters to maintain acceptable critical dimensions across each die of mass-produced semiconductor wafers154US 5,655,110 AAdvanced Micro Devices, Inc. · 1997
- Method for setting and adjusting process parameters to maintain acceptable critical dimensions across each die of mass-produced semiconductor wafers108US 5,646,870 AAdvanced Micro Devices, Inc. · 1997
- Data analyzer system and method for manufacturing control environment82US 6,381,556 B1Ciena Corporation · 2002