G05B 2219/31433
Diagnostic unit per zone of manufacturing
G05B2219/31433 (Diagnostic unit per zone of manufacturing) appears on 5 US grants and 8 published applications in this corpus.
Search patents in G05B- Granted patents
- 5
- Published applications
- 8
- Assignees
- 7
- Inventors
- 29
- Latest grant
- 10 Sep 2024
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2006 | 0 | 1 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 2 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 1 | 0 |
| 2015 | 0 | 1 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 1 | 1 |
| 2019 | 0 | 0 |
| 2020 | 1 | 1 |
| 2021 | 0 | 0 |
| 2022 | 0 | 0 |
| 2023 | 1 | 0 |
| 2024 | 1 | 1 |
| 2025 | 0 | 0 |
| 2026 | 0 | 1 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Systems and methods for container-based data collection and analysis in an operational technology network10 Sep 2024US 12,085,486 B2Rockwell Automation Technologies, Inc.
- Manufacturing process monitoring apparatus31 Jan 2023US 11,567,482 B2Toshiba Mitsubishi-Electric Industrial Systems Corporation
- Operating state acquisition apparatus, production management system, and production management method for manufacturing line25 Feb 2020US 10,571,899 B2i Smart Technologies Corporation
- Method and system for automatically collecting semiconductor manufacturing parameters24 Jul 2018US 10,031,516 B2Semiconductor Manufacturing International (Shanghai) Corporation
- Field communication test device and field communication test system using the same7 Oct 2014US 8,856,377 B2Yokogawa Electric Corporation
- Technologies for performing efficient diagnostic operations on a robotic manufacturing system28 May 2026US 2026/0147328 A1
- Systems and methods for container-based data collection and analysis in an operational technology network28 Mar 2024US 2024/0102890 A1Rockwell Automation Technologies, Inc.
- Manufacturing process monitoring apparatus21 May 2020US 2020/0159196 A1Toshiba Mitsubishi-Electric Industrial Systems Corporation
- Operating state acquisition apparatus, production management system, and production management method for manufacturing line22 Feb 2018US 2018/0052452 A1i Smart Technologies Corporation
- Method and system for automatically collecting semiconductor manufacturing parameters8 Oct 2015US 2015/0287621 A1Semiconductor Manufacturing International (Shanghai) Corporation
Most cited
By later US patents