G05B 2219/31357
Observer based fault detection, use model
G05B2219/31357 (Observer based fault detection, use model) appears on 33 US grants and 45 published applications in this corpus.
Search patents in G05B- Granted patents
- 33
- Published applications
- 45
- Assignees
- 32
- Inventors
- 118
- Latest grant
- 2 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2002 | 0 | 1 |
| 2003 | 3 | 4 |
| 2004 | 3 | 0 |
| 2005 | 1 | 5 |
| 2006 | 2 | 4 |
| 2007 | 2 | 2 |
| 2008 | 2 | 2 |
| 2009 | 1 | 2 |
| 2010 | 1 | 0 |
| 2011 | 1 | 1 |
| 2012 | 0 | 1 |
| 2013 | 0 | 0 |
| 2014 | 1 | 2 |
| 2015 | 1 | 2 |
| 2016 | 0 | 0 |
| 2017 | 1 | 2 |
| 2018 | 1 | 1 |
| 2019 | 2 | 1 |
| 2020 | 0 | 2 |
| 2021 | 2 | 7 |
| 2022 | 1 | 1 |
| 2023 | 4 | 2 |
| 2024 | 1 | 1 |
| 2025 | 1 | 2 |
| 2026 | 2 | 0 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Anomaly detection using root cause analysis in a probabilistic multi-component calibrated model2 Jun 2026US 12,645,206 B2Geminus.AI, Inc.
- System and method for unsupervised prediction of machine failures13 Jan 2026US 12,524,293 B2Aktiebolaget Skf
- Sensor metrology data integration22 Jul 2025US 12,366,853 B2APPLIED Materials.Inc.
- Analysis method and devices for same12 Mar 2024US 11,927,946 B2Dürr Systems AG
- Event estimation system and event estimation method31 Oct 2023US 11,803,178 B2Kabushiki Kaisha Yaskawa Denki
- Data intergration28 Aug 2025US 2025/0271847 A1APPLIED Materials.Inc.
- Operating method for a coating system, and coating system for carrying out the operating method1 May 2025US 2025/0135480 A1
- Anomaly detection using root cause analysis in a probabilistic multi-component calibrated model22 Aug 2024US 2024/0280974 A1Geminus.Al, Inc.
- Method of monitoring an electrical machine6 Jul 2023US 2023/0213583 A1ABB Schweiz AG
- Sensor metrology data intergration29 Jun 2023US 2023/0205196 A1APPLIED Materials.Inc.
Most cited
By later US patents
- Determining associations and alignments of process elements and measurements in a process144US 9,804,588 B2Fisher-Rosemount Systems, Inc. · 2017
- Multivariate control of semiconductor processes68US 7,151,976 B2MKS Instruments, Inc. · 2006
- Method and apparatus for monitoring tool health46US 6,594,589 B1Advanced Micro Devices, Inc. · 2003
- Identifying a cause of a fault based on a process controller output46US 6,778,873 B1Advanced Micro Devices, Inc. · 2004
- Integration of fault detection with run-to-run control45US 7,337,019 B2APPLIED Materials.Inc. · 2008