G03H 2001/0456
Spatial heterodyne, i.e. filtering a fourier transform of the off-axis record
Official title: {Spatial heterodyne, i.e. filtering a Fourier transform of the off-axis record}
G03H2001/0456 (Spatial heterodyne, i.e. filtering a fourier transform of the off-axis record) appears on 76 US grants and 84 published applications in this corpus.
Search patents in G03H- Granted patents
- 76
- Published applications
- 84
- Assignees
- 55
- Inventors
- 173
- Latest grant
- 3 Mar 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2000 | 1 | 0 |
| 2001 | 0 | 1 |
| 2002 | 0 | 0 |
| 2003 | 1 | 2 |
| 2004 | 3 | 12 |
| 2005 | 3 | 3 |
| 2006 | 9 | 5 |
| 2007 | 3 | 0 |
| 2008 | 3 | 0 |
| 2009 | 0 | 1 |
| 2010 | 0 | 1 |
| 2011 | 2 | 4 |
| 2012 | 1 | 5 |
| 2013 | 3 | 7 |
| 2014 | 5 | 1 |
| 2015 | 2 | 3 |
| 2016 | 1 | 4 |
| 2017 | 4 | 6 |
| 2018 | 8 | 6 |
| 2019 | 8 | 8 |
| 2020 | 6 | 6 |
| 2021 | 1 | 3 |
| 2022 | 6 | 1 |
| 2023 | 3 | 1 |
| 2024 | 2 | 2 |
| 2025 | 0 | 1 |
| 2026 | 1 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Dark field digital holographic microscope and associated metrology method3 Mar 2026US 12,566,406 B2ASML Netherlands B. V.
- Methods and systems of holographic interferometry6 Feb 2024US 11,892,292 B2RD Synergy Ltd.
- Systems and methods for simultaneous multi-channel off-axis holography6 Feb 2024US 11,892,801 B2KBR Wyle Services, LLC
- System for spatial multiplexing26 Sep 2023US 11,768,068 B2Ramot at Tel-Aviv University Ltd.
- Lensfree method for imaging biological samples in three dimensions27 Jun 2023US 11,687,031 B2Imec Vzw
- Dark field digital holographic microscope and associated metrology method2 Jul 2026US 2026/0186446 A1ASML Netherlands B. V.
- Optical measurement system and optical measurement method30 Oct 2025US 2025/0334525 A1Otsuka Electronics Co., Ltd.
- Systems and methods for an imaging device6 Jun 2024US 2024/0184241 A1Rjs Mediagnostix
- Digital holographic microscope and associated metrology method16 May 2024US 2024/0160151 A1ASML Holding N. V.
- Dark field digital holographic microscope and associated metrology method26 Oct 2023US 2023/0341813 A1ASML Netherlands B. V.
Most cited
By later US patents
- Method and apparatus using interferometric metrology for high aspect ratio inspection54US 7,061,625 B1KLA-Tencor Technologies Corporation · 2006
- Direct-to-digital holography and holovision39US 6,078,392 ALockheed Martin Energy Research Corporation · 2000
- Phase imaging using multi-wavelength digital holography36US 6,809,845 B1University of South Florida · 2004
- Method and device for obtaining a sample with three-dimensional microscopy30US 7,009,700 B2Universite Libre de Bruxelles · 2006
- Acquisition and replay systems for direct-to-digital holography and holovision20US 6,525,821 B1UT-Battelle, LLC · 2003