G01R 19/08
Measuring current density
G01R19/08 (Measuring current density) appears on 29 US grants and 15 published applications in this corpus.
Search patents in G01R- Granted patents
- 29
- Published applications
- 15
- Assignees
- 28
- Inventors
- 89
- Latest grant
- 10 Dec 2024
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 2 | 0 |
| 1978 | 2 | 0 |
| 1979 | 1 | 0 |
| 1980 | 0 | 0 |
| 1981 | 4 | 0 |
| 1982 | 1 | 0 |
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 2 | 0 |
| 1987 | 1 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 1 | 1 |
| 2004 | 1 | 1 |
| 2005 | 1 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 1 |
| 2010 | 0 | 0 |
| 2011 | 0 | 1 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 1 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 1 |
| 2017 | 0 | 0 |
| 2018 | 2 | 2 |
| 2019 | 1 | 2 |
| 2020 | 2 | 2 |
| 2021 | 0 | 0 |
| 2022 | 1 | 2 |
| 2023 | 2 | 0 |
| 2024 | 1 | 1 |
| 2025 | 0 | 0 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Setting device10 Dec 2024US 12,162,108 B2Profil Verbindungstechnik GMBH & Co.KG
- Method for determining the spatial distribution of electrical current density in a two-dimensional material device12 Sep 2023US 11,754,603 B2Imec Vzw
- Semiconductor device and method for measuring current of semiconductor device7 Mar 2023US 11,600,705 B2Semiconductor Energy Laboratory Co.Ltd.
- Tester and electrical connectors for insulated glass units22 Feb 2022US 11,255,120 B2View, Inc.
- Large surface magnetic field sensor array9 Jun 2020US 10,677,612 B2The Boeing Company
- Method and system for current density maps reconstruction by jointly optimizing magnetic field maps17 Sep 2026US 2026/0276682 A1Tata Consultancy Services Limited
- Setting Device22 Feb 2024US 2024/0058907 A1Profil Verbindungstechnik GMBH & Co.KG
- Tester and electrical connectors for insulated glass units5 May 2022US 2022/0136319 A1View, Inc.
- Method for Determining the Spatial Distribution of Electrical Current Density in a Two-dimensional Material Device13 Jan 2022US 2022/0011355 A1Imec Vzw
- Semiconductor device and method for measuring current of semiconductor device28 May 2020US 2020/0168710 A1Semiconductor Energy Laboratory Co.Ltd.
Most cited
By later US patents
- Beam current sensor27US 4,687,987 AThe United States of America as represented by the United States Department of Energy · 1987
- Tester and electrical connectors for insulated glass units19US 11,255,120 B2View, Inc. · 2022
- Ion-controlled diode16US 4,103,227 AUniversity of Pennsylvania · 1978
- Electrostatic monitoring system14US 4,258,736 ABestobell Mobrey Limited · 1981
- Coaxial probe for measuring the current density profile of intense electron beams11US 4,629,975 AThe United States of America as represented by the Secretary of the Navy · 1986