Coaxial probe for measuring the current density profile of intense electron beams
AssigneeThe United States of America as represented by the Secretary of the Navy
InventorsRalph Fiorito, Michael Raleigh
Life of this patent
Estimating the term…
Abstract
An interceptive type electric probe for mapping the radial current density rofile of high energy and high current electron beams comprises an input sensor, an interface support connector and an output support connector. The entire structure of the electric probe is configured to closely approximate a coaxial transmission line of a predetermined impedance that is opened ended but yet shielded. The nature of the construction of the probe, in terms of materials and techniques, allows for survival thereof in high temperature and intense beam environments.
Claims11
A coaxial electric probe for mapping the radial current density profile of a high energy and high current electron beam generated in an associated accelerator tube, said coaxial electric probe comprising:
- an input sensor configured so as to eliminate capacitive coupling between the electron beam and said input sensor and reduce the effects of radio frequency (RF) fields, due to noise generated by the electron beam, when said input sensor is inserted and then scanned radially therein, the input sensor comprising:
- an inner sensor tip configured to be cylindrical with a predetermined diameter uniformly formed from one end thereof, along its length, to an integral but larger inner sensor tip shoulder at its other end;
- an outer sensor tip shield configured to be cylindrical with predetermined inner and outer diameters uniformly formed from one end thereof, along its length, to an integral but larger outer sensor tip shield shoulder at its other end, said outer sensor tip shield being coaxially disposed about said inner sensor tip so as to form a uniform gap therearound along their lengths a predetermined distance so as to form substantially an open ended but shielded coaxial transmission line of a predetermined impedance;
- an interface support connector configured so as to support said input sensor and form an electrical connection therebetween, the inner interface conductor having an integrally formed inner interface conductor shoulder support sleeve at one end thereof, said inner interface conductor being configured to be cylindrical with a predetermiend diameter substantially uniformly formed, along its length, from the one end to the other end thereof, said inner sensor tip of said input sensor being mechanically supported and electrically connected to said inner interface conductor via an interference fit joint formed between said inner sensor tip shoulder of said inner sensor tip and said inner interface conductor shoulder support sleeve of said inner interface conductor;
- and
- an output support connector configured so as to support said interface support connector and form an electrical connection between, the outer interface conductor having an integrally formed outer interface conductor shoulder support sleeve at one end thereof, said outer interface conductor being configured to be cylindrical with predetermined inner and outer diameters substantially uniformly formed, along its length, from the one end to the other end thereof, said outer sensor tip shield of said input sensor being mechanically supported and electrically connected to said outer interface conductor via an interference fit joint formed between said outer sensor tip shield shoulder of said outer sensor tip shield and said outer interface conductor shoulder support sleeve, said outer interface conductor being coaxially disposed about said inner interface conductor thereby forming a larger uniform gap therearound.
The coaxial electric probe of claim 3 wherein said outer interface conductor of said interface support connector further comprises an outer interface conductor neck fashioned therein adjacent to the interference fit joint formed between said outer sensor tip shield shoulder of said outer sensor tip shield and said outer interference conductor, such that the interference fit joint can be bent at said outer interface conductor neck to adjust the alignment of said outer sensor tip shield in respect to said inner sensor tip.
Dependencies are inferred from the claim text.