G01N 29/46
By spectral analysis
Official title: by spectral analysis, e.g. Fourier analysis {or wavelet analysis (spectral signal processing per se G06F17/14)}
G01N29/46 (By spectral analysis) appears on 1,034 US grants and 1,161 published applications in this corpus.
Search patents in G01N- Granted patents
- 1,034
- Published applications
- 1,161
- Assignees
- 748
- Inventors
- 2,738
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 1 | 0 |
| 1980 | 1 | 0 |
| 1981 | 5 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 3 | 0 |
| 1985 | 1 | 0 |
| 1986 | 1 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 3 | 0 |
| 1990 | 6 | 0 |
| 1991 | 2 | 0 |
| 1992 | 1 | 0 |
| 1993 | 3 | 0 |
| 1994 | 3 | 0 |
| 1995 | 6 | 0 |
| 1996 | 2 | 0 |
| 1997 | 12 | 0 |
| 1998 | 8 | 0 |
| 1999 | 17 | 0 |
| 2000 | 22 | 0 |
| 2001 | 24 | 3 |
| 2002 | 36 | 23 |
| 2003 | 24 | 31 |
| 2004 | 34 | 38 |
| 2005 | 26 | 34 |
| 2006 | 26 | 25 |
| 2007 | 19 | 27 |
| 2008 | 21 | 24 |
| 2009 | 19 | 20 |
| 2010 | 10 | 14 |
| 2011 | 18 | 27 |
| 2012 | 15 | 27 |
| 2013 | 13 | 25 |
| 2014 | 20 | 45 |
| 2015 | 17 | 40 |
| 2016 | 24 | 44 |
| 2017 | 26 | 47 |
| 2018 | 40 | 83 |
| 2019 | 67 | 74 |
| 2020 | 72 | 92 |
| 2021 | 55 | 87 |
| 2022 | 70 | 92 |
| 2023 | 81 | 82 |
| 2024 | 80 | 66 |
| 2025 | 55 | 60 |
| 2026 | 41 | 31 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Defect sizing combining fixed wavelength and variable wavelength guided waves29 Sep 2026US 12,748,079 B2Innerspec Technologies, Inc.
- Quality evaluation method and quality evaluation device8 Sep 2026US 12,730,092 B2Nissan Motor Co., Ltd.
- Method, device and computer program for estimating a speed of a wheeled vehicle8 Sep 2026US 12,730,121 B2Institut National De Recherche En Informatique Et En Automatique
- Non-destructive inspection method including inspecting multiple observation sites and method of manufacturing semiconductor memory device using the same25 Aug 2026US 12,716,832 B2Samsung Electronics Co., Ltd.
- Material selection system and method for constructing a musical instrument25 Aug 2026US 12,716,875 B1
- Detection of damage to components within an electrolyzer stack during operation8 Oct 2026US 2026/0308789 A1Fourier Earth, Inc.
- Transformer stacked iron core elasticity matrix determination method and vibration analysis method, and non-transitory computer readable medium8 Oct 2026US 2026/0309681 A1Jfe Steel Corporation
- Medical device for identifying, in particular presence identification, and/or classifying a medical item1 Oct 2026US 2026/0301909 A1
- Artificial intelligence-based internal defect detection system for concrete members17 Sep 2026US 2026/0276604 A1Seoul National University R&Db Foundation
- System for and method of inspecting semiconductor devices, and method of manufacturing the devices including the method10 Sep 2026US 2026/0266773 A1Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Most cited
By later US patents
- Configurable vibration sensor870US 7,093,492 B2Mechworks Systems Inc. · 2006
- Ultrasonic non-destructive evaluation of thin specimens213US 5,305,239 AThe Texas A&M University System · 1994
- Health monitoring196US 6,928,370 B2Oxford Biosignals Limited · 2005
- Fluid parameter measurement in pipes using acoustic pressures191US 6,354,147 B1CiDRA Corporation · 2002
- Method and apparatus for measuring characteristics of meat186US 5,872,314 A1999