G01N 29/069

Defect imaging, localisation and sizing using

Official title: {Defect imaging, localisation and sizing using, e.g. time of flight diffraction [TOFD], synthetic aperture focusing technique [SAFT], Amplituden-Laufzeit-Ortskurven [ALOK] technique}

G01N29/069 (Defect imaging, localisation and sizing using) appears on 397 US grants and 470 published applications in this corpus.

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Granted patents
397
Published applications
470
Assignees
280
Inventors
1,099
Latest grant
6 Oct 2026

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G01N 29/069: granted patents and published applications per publication year
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198410
198510
198630
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198810
198900
199000
199100
199200
199300
199410
199540
199660
199760
199830
199930
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200130
200213
200335
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200566
200687
200748
200865
2009414
2010610
2011817
2012914
20131625
20141817
20151520
20161812
20171521
20181621
20192125
20202525
20211941
20222540
20232842
20243235
20253325
20261824

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