G01N 27/92
Investigating or analysing materials by the use of electric, electrochemical, or magnetic
Official title: by investigating breakdown voltage (G01N27/60, G01N27/62 take precedence)
G01N27/92 (Investigating or analysing materials by the use of electric, electrochemical, or magnetic) appears on 45 US grants and 36 published applications in this corpus.
Search patents in G01N- Granted patents
- 45
- Published applications
- 36
- Assignees
- 41
- Inventors
- 118
- Latest grant
- 10 Mar 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1983 | 1 | 0 |
| 1984 | 1 | 0 |
| 1985 | 1 | 0 |
| 1986 | 1 | 0 |
| 1987 | 1 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 1 | 0 |
| 1997 | 2 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 2 | 0 |
| 2001 | 2 | 0 |
| 2002 | 2 | 1 |
| 2003 | 5 | 3 |
| 2004 | 1 | 1 |
| 2005 | 2 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 2 |
| 2010 | 2 | 2 |
| 2011 | 1 | 1 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 1 | 2 |
| 2015 | 1 | 1 |
| 2016 | 0 | 2 |
| 2017 | 2 | 2 |
| 2018 | 1 | 2 |
| 2019 | 3 | 1 |
| 2020 | 0 | 1 |
| 2021 | 1 | 3 |
| 2022 | 2 | 2 |
| 2023 | 2 | 4 |
| 2024 | 2 | 2 |
| 2025 | 1 | 4 |
| 2026 | 2 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method for measuring yield strength of 3D printed metallic member using magnetic incremental permeability and measurement system for the same10 Mar 2026US 12,571,766 B2Korea Advanced Institute of Science and Technology
- Electrical stability probe with temperature sensor27 Jan 2026US 12,535,475 B2Schlumberger Technology Corporation
- Contamination detection method8 Jul 2025US 12,354,922 B2Texas Instruments Incorporated
- Gas and particle sensor using voltage and current behavior between electrodes during glow-to-arc transition16 Apr 2024US 11,959,878 B2Southwest Research Institute
- System and method for cleaning electrical stability probe6 Feb 2024US 11,892,421 B2Schlumberger Technology Corporation
- Contamination detection method18 Sep 2025US 2025/0293101 A1Texas Instruments Incorporated
- Electrical stability probe with temperature sensor14 Aug 2025US 2025/0258155 A1Schlumberger Technology Corporation
- Automated electrical characterization on HV cable peeling29 May 2025US 2025/0172605 A1
- Smart holiday detection and data storage6 Mar 2025US 2025/0076240 A1Pipeline Supply & Service, LLC
- Method for discriminant monitoring of a composite multi-material assembly7 Nov 2024US 2024/0369513 A1Epsilon Composite
Most cited
By later US patents
- Method for determining cell membrane dielectric breakdown42US 4,472,506 A1984
- Tire defect tester23US 4,516,068 APaul E. Hawkinson Company · 1985
- Pulse voltage breakdown (VBD) technique for inline gate oxide reliability monitoring21US 6,602,729 B2Infineon Technologies AG · 2003
- Semiconductor device evaluation method, method of controlling the semiconductor device production processes and recording medium20US 6,077,719 AMatsushita Electronics Corporation · 2000
- Method and apparatus for lifetime prediction of dielectric breakdown20US 6,326,792 B1Matsushita Electronics Corporation · 2001