G01N 2223/1016
X-ray
G01N2223/1016 (X-ray) appears on 344 US grants and 483 published applications in this corpus.
Search patents in G01N- Granted patents
- 344
- Published applications
- 483
- Assignees
- 259
- Inventors
- 1,136
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 2 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 2 | 0 |
| 1992 | 2 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 3 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 3 |
| 2007 | 1 | 2 |
| 2008 | 3 | 5 |
| 2009 | 2 | 3 |
| 2010 | 0 | 3 |
| 2011 | 4 | 7 |
| 2012 | 2 | 9 |
| 2013 | 5 | 6 |
| 2014 | 7 | 7 |
| 2015 | 5 | 6 |
| 2016 | 9 | 7 |
| 2017 | 4 | 9 |
| 2018 | 5 | 7 |
| 2019 | 10 | 28 |
| 2020 | 23 | 34 |
| 2021 | 29 | 37 |
| 2022 | 30 | 50 |
| 2023 | 35 | 51 |
| 2024 | 47 | 67 |
| 2025 | 57 | 80 |
| 2026 | 49 | 62 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Image analyzer for material structure using Fourier transform and principal component analysis6 Oct 2026US 12,755,511 B2Toyota Jidosha Kabushiki Kaisha
- Nanophotonic scintillators for high-energy particles detection, imaging, and spectroscopy29 Sep 2026US 12,748,060 B2Massachusetts Institute of Technology
- Patterned X-ray emitting target29 Sep 2026US 12,749,642 B2Nova Measuring Instruments Ltd.
- Differentiation of clastic sedimentary systems using March-Dollase preferred orientation actor15 Sep 2026US 12,736,486 B2Saudi Arabian Oil Company
- X-ray inspection apparatus15 Sep 2026US 12,736,688 B2Ishida Co., Ltd.
- Method for scanning an object in a scanning apparatus8 Oct 2026US 2026/0309651 A1ROLLS-ROYCE plc
- Temperature control device for triaxial loading experiment and method thereof, and triaxial loading experiment device1 Oct 2026US 2026/0298785 A1Jilin University
- X-ray inspection device and preventive maintenance device therefor1 Oct 2026US 2026/0298843 A1Anritsu Corporation
- Tomographic imaging system geometry to mitigate artifacts1 Oct 2026US 2026/0298845 A1
- Device for Contactless Measurement of the Microstructure of Moving Material Webs1 Oct 2026US 2026/0298848 A1IMS Messsysteme GmbH
Most cited
By later US patents
- System for quantitative radiographic imaging202US 5,864,146 AUniversity of Massachusetts Medical Center · 1999
- Computerized tomographic x-ray scanner system and gantry assembly173US 5,014,293 AImatron, Inc. · 1991
- Mobile aircraft inspection system79US 8,483,356 B2Rapiscan Systems, Inc. · 2013
- X-ray interferometer for phase contrast imaging55US 8,041,004 B2Paul Scherrer Institut · 2011
- Diffraction grating and alignment method thereof, and radiation imaging system51US 8,755,487 B2FUJIFILM Corporation · 2014