G01N 2203/0051
Piezoelectric means
G01N2203/0051 (Piezoelectric means) appears on 120 US grants and 92 published applications in this corpus.
Search patents in G01N- Granted patents
- 120
- Published applications
- 92
- Assignees
- 96
- Inventors
- 289
- Latest grant
- 1 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 3 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 2 | 0 |
| 1994 | 2 | 0 |
| 1995 | 3 | 0 |
| 1996 | 3 | 0 |
| 1997 | 2 | 0 |
| 1998 | 2 | 0 |
| 1999 | 4 | 0 |
| 2000 | 3 | 0 |
| 2001 | 6 | 2 |
| 2002 | 2 | 5 |
| 2003 | 9 | 9 |
| 2004 | 10 | 3 |
| 2005 | 2 | 10 |
| 2006 | 8 | 4 |
| 2007 | 4 | 7 |
| 2008 | 2 | 4 |
| 2009 | 5 | 6 |
| 2010 | 6 | 5 |
| 2011 | 5 | 5 |
| 2012 | 4 | 7 |
| 2013 | 3 | 4 |
| 2014 | 3 | 0 |
| 2015 | 0 | 1 |
| 2016 | 7 | 2 |
| 2017 | 3 | 2 |
| 2018 | 2 | 1 |
| 2019 | 1 | 2 |
| 2020 | 2 | 2 |
| 2021 | 0 | 1 |
| 2022 | 2 | 2 |
| 2023 | 1 | 1 |
| 2024 | 0 | 3 |
| 2025 | 4 | 4 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- In-situ micro-nano impact indentation testing instrument1 Sep 2026US 12,723,958 B2Jilin University
- Device and method for the thermo-electro- mechanical characterization of microscale wires2 Dec 2025US 12,487,156 B2Arizona Board of Regents on behalf of Arizona State University
- Micro-nano impact indentation testing device and method based on cyclic refrigeration7 Oct 2025US 12,436,072 B1Jilin University
- Combination piezoelectric actuator and sensor19 Aug 2025US 12,395,100 B2MTS Systems Corporation
- Rapid dot matrix micro-nano impact indentation testing system11 Mar 2025US 12,247,956 B1Jilin University
- Material testing systems with testing system sensor verification device4 Dec 2025US 2025/0369848 A1Illinois Tool Works Inc.
- Testing of Electronic Assemblies and Electronic Assemblies Having a Device for Testing23 Oct 2025US 2025/0327858 A1Siemens Aktiengesellschaft
- In-situ micro-nano impact indentation testing instrument9 Oct 2025US 2025/0314571 A1Jilin University
- Driving device for detecting mechanical characteristics and electrical characteristics of cells24 Apr 2025US 2025/0130149 A1Zhejiang Normal University
- Soft leaf tissue elasticity tester and use thereof for measuring plant health31 Oct 2024US 2024/0361291 A1Intelligent Sentinel LLC
Most cited
By later US patents
- Method and system for assessing quality of spot welds176US 7,132,617 B2DaimlerChrysler AG · 2006
- Multi-dimensional capacitive transducer146US 5,869,751 AHysitron, Inc. · 1999
- Frequency deviation detecting circuit and measuring apparatus using the frequency deviation detecting circuit109US 5,766,137 AAxiom · 1998
- Method and system for assessing quality of spot welds107US 7,516,022 B2Chrysler Corporation · 2009
- Systems and methods to determine elastic properties of materials86US 7,107,159 B22006