In-situ micro-nano impact indentation testing instrument

An in-situ micro-nano impact indentation testing instrument, wherein a high-temperature loading unit and a low-temperature loading unit of a high/low-temperature loading module are mounted in parallel on a right side wall of an environmental chamber, an optical imaging unit and an infrared imaging unit of the optical-infrared in-situ monitoring module are respectively arranged on a left side wall and a rear side wall of the environmental chamber, and both an electromagnetic-piezoelectric coupling impact module and a microscopic imaging module are mounted at a bottom of the environmental chamber;

• wherein the electromagnetic-piezoelectric coupling impact module is provided with an indenter that horizontally impacts a high-temperature specimen clamped on the high-temperature loading unit on a right side under the driving of an electromagnetic linear motor and a piezoelectric stack;
• the high-temperature and low-temperature loading units are fixed on the same horizontal sliding rail, and a motor on the horizontal sliding rail drives the low-temperature loading unit to move to a front side of the electromagnetic-piezoelectric coupling impact module, so that the switching from a high-temperature impact indentation test to a low-temperature impact indentation test is completed;
• in-situ monitoring is performed on the testing process by the optical-infrared in-situ monitoring module combined with a second acoustic emission sensor and a first acoustic emission sensor in the high-temperature and low-temperature loading units;
• and the microscopic imaging module is configured to select a test area before impact indentation and observe residual morphology after impact indentation.