G01N 21/8903
Using a multiple detector array
Official title: {using a multiple detector array}
G01N21/8903 (Using a multiple detector array) appears on 193 US grants and 142 published applications in this corpus.
Search patents in G01N- Granted patents
- 193
- Published applications
- 142
- Assignees
- 175
- Inventors
- 496
- Latest grant
- 10 Feb 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 3 | 0 |
| 1980 | 4 | 0 |
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 2 | 0 |
| 1986 | 1 | 0 |
| 1987 | 2 | 0 |
| 1988 | 2 | 0 |
| 1989 | 2 | 0 |
| 1990 | 6 | 0 |
| 1991 | 2 | 0 |
| 1992 | 3 | 0 |
| 1993 | 5 | 0 |
| 1994 | 4 | 0 |
| 1995 | 4 | 0 |
| 1996 | 3 | 0 |
| 1997 | 8 | 0 |
| 1998 | 6 | 0 |
| 1999 | 4 | 0 |
| 2000 | 6 | 0 |
| 2001 | 5 | 0 |
| 2002 | 3 | 4 |
| 2003 | 4 | 3 |
| 2004 | 7 | 8 |
| 2005 | 4 | 8 |
| 2006 | 10 | 9 |
| 2007 | 2 | 7 |
| 2008 | 10 | 4 |
| 2009 | 3 | 3 |
| 2010 | 3 | 6 |
| 2011 | 3 | 6 |
| 2012 | 2 | 5 |
| 2013 | 2 | 4 |
| 2014 | 7 | 5 |
| 2015 | 4 | 6 |
| 2016 | 6 | 4 |
| 2017 | 5 | 7 |
| 2018 | 6 | 10 |
| 2019 | 4 | 7 |
| 2020 | 7 | 4 |
| 2021 | 4 | 6 |
| 2022 | 1 | 8 |
| 2023 | 4 | 8 |
| 2024 | 7 | 4 |
| 2025 | 7 | 4 |
| 2026 | 2 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
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- Pinhole detection device3 Feb 2026US 12,540,903 B2Toyo Kohan Co.Ltd
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- THz measuring device and THz measuring method for measuring a transported measuring object12 Aug 2025US 12,385,831 B2CiTEX Holding GmbH
- Systems and methods for detecting defects in magnet wire insulation10 Jun 2025US 12,326,470 B2Essex Solutions USA LLC
- Pole inspection device and inspection method20 Aug 2026US 2026/0243696 A1Contemporary Amperex Technology Co., Limited
- Pinhole detection device18 Jun 2026US 2026/0168934 A1Toyo Kohan Co.Ltd
- Optical apparatus, optical inspection system, and optical inspection method18 Dec 2025US 2025/0383287 A1Kabushiki Kaisha Toshiba
- Method for material testing of an object in a production and/or conveyor line and inspection apparatus11 Dec 2025US 2025/0377309 A1Isra Vision AG
- System and method for measuring the color of an area of a sample6 Nov 2025US 2025/0341419 A1Fyla Laser, S. L.
Most cited
By later US patents
- Apparatus for determining with high resolution the position of edges of a web202US 4,559,451 ADe La Rue Systems Limited · 1985
- Composite material laser flaw detection106US 5,562,788 AThe Boeing Company · 1996
- Video inspection system employing multiple spectrum LED illumination99US 5,365,084 APressco Technology Inc. · 1994
- Real time automated inspection90US 4,519,041 AHoneywell Inc. · 1985
- Engineered lighting system for TDI inspection comprising means for controlling lighting elements in accordance with specimen displacement84US 5,172,005 APressco Technology Inc. · 1992