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US 12,385,831 B2Granted
THz measuring device and THz measuring method for measuring a transported measuring object
AssigneeCiTEX Holding GmbH
InventorMarius Thiel
Life of this patent
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Abstract
The present disclosure relates to a THz measuring device for measuring an extruded measuring object.
Claims24
A Terahertz (THz) measuring device for measuring a transported, in particular extruded, measuring object, the Terahertz (THz) measuring device comprising:
- one or more Terahertz (THz) transceivers arranged around a longitudinal axis,
- a first mirror means including one or more first deflection mirrors,
- a second mirror means being arranged offset along the longitudinal axis (A) in relation to the first mirror means, the second mirror means including one or more second deflection mirrors,
- each Terahertz (THz) transceiver being configured to send a Terahertz (THz) transmission beam along its optical axis, which runs perpendicular to the longitudinal axis, radially inwards towards a first deflection mirror each, in such a manner that the Terahertz (THz) transmission beam
- is reflected at the first deflection mirror and runs along the longitudinal axis as a lengthwise running transmitted beam and is subsequently reflected at a second deflection mirror in a direction radially outwards as a radial reflected beam and
- is deflected, in a direction perpendicular to the longitudinal axis, and, following an inwards reflection, is subsequently reflected back via the second mirror means and the first mirror means towards the respective Terahertz (THz) transceiver, the Terahertz (THz) transceiver supplying a measuring signal,
- the Terahertz (THz) measuring device being configured to determine a property of the measuring object from the measurement signals of the Terahertz (THz) transceivers,
- the property of the measuring object being one or more elements of the group consisting of:
- a layer thickness of the measuring object at various locations of the longitudinal axis and/or various locations on the circumference,
- a refraction index of the measuring object,
- inclusions of air and other substances inside the measuring object
- irregular formation of boundary surfaces, and
- formation of boundary surfaces of the measuring object that are non-parallel to the longitudinal axis.
10 more elements
A Terahertz (THz) measuring method for measuring an extruded measuring object, in particular an extruded string, e.g. pipe, or an extruded blow film,
- including the following steps:
- arranging or providing a Terahertz (THz) measuring device including one or more Terahertz (THz) transceivers arranged around a longitudinal axis of an extruder, where the extruder continuously extrudes a measuring object along the longitudinal axis in a transport direction, the Terahertz (THz) transceivers each putting out a Terahertz (THz) transmission beam along their respective optical axis perpendicular to the longitudinal axis inwards through the extruded measuring object, the Terahertz (THz) transmission beams subsequently being reflected each at a first deflection mirror of a first mirror means such that they run along the longitudinal axis,
- the Terahertz (THz) transmission beams subsequently being reflected at a second mirror means including one or more second deflection mirrors such that they run as radial reflected beams perpendicular to the longitudinal axis radially outwards and pass through the measuring object towards the outside,
- the Terahertz (THz)-transmitted beams subsequently being reflected from the outside back towards the inside through the measuring object back to the second mirror means, the first mirror means and the Terahertz (THz) transceivers,
- wherein one or more properties of the extruded measuring object being determined from measuring signals of the Terahertz (THz) transceivers, the properties being selected from the group consisting of:
- a layer thickness of the measuring object at various locations of the longitudinal axis and/or various circumferential locations,
- a refraction index of the measuring object,
- inclusions of air and other substances in the measuring object
- irregular formation of boundary surfaces, and
- formation of boundary surfaces of the measuring object running non-parallel to the longitudinal axis.
7 more elements
Dependencies are inferred from the claim text.