G01N 2021/8838
Stroboscopic illumination
Official title: {Stroboscopic illumination; synchronised illumination}
G01N2021/8838 (Stroboscopic illumination) appears on 50 US grants and 56 published applications in this corpus.
Search patents in G01N- Granted patents
- 50
- Published applications
- 56
- Assignees
- 50
- Inventors
- 171
- Latest grant
- 7 Apr 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 2 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 0 |
| 2003 | 1 | 0 |
| 2004 | 1 | 1 |
| 2005 | 1 | 2 |
| 2006 | 1 | 2 |
| 2007 | 1 | 1 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 2 | 2 |
| 2011 | 2 | 2 |
| 2012 | 1 | 1 |
| 2013 | 0 | 1 |
| 2014 | 0 | 2 |
| 2015 | 1 | 2 |
| 2016 | 5 | 5 |
| 2017 | 2 | 2 |
| 2018 | 5 | 3 |
| 2019 | 3 | 3 |
| 2020 | 5 | 3 |
| 2021 | 0 | 2 |
| 2022 | 1 | 2 |
| 2023 | 2 | 4 |
| 2024 | 3 | 3 |
| 2025 | 6 | 4 |
| 2026 | 1 | 9 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Vision inspection systems and methods using light sources of different wavelengths7 Apr 2026US 12,596,080 B2GM Global Technology Operations LLC
- Method for illuminating a substrate using multiple acousto optical devices19 Aug 2025US 12,393,093 B2Applied Materials Israel Ltd.
- Dark field illumination based on laser illuminated phosphor17 Jun 2025US 12,332,176 B2Camtek Ltd.
- Stroboscopic stepped illumination defect detection system27 May 2025US 12,313,561 B2Casi Vision Technology (Beijing) Co., Ltd.
- System and method for imaging reflecting objects15 Apr 2025US 12,276,614 B2Siemens Aktiengesellschaft
- Monitoring a mechanism containing a spring3 Sep 2026US 2026/0259150 A1Odysight.Ai Ltd.
- Surface inspection systems and methods20 Aug 2026US 2026/0243669 A1The Boeing Company
- Combined laser sources for sample characterization13 Aug 2026US 2026/0235527 A1KLA Corporation
- System and method for illumination of an imaged scene using a programmable light source13 Aug 2026US 2026/0235931 A1Cognex Corporation
- Stroboscopic high-throughput imaging system23 Jul 2026US 2026/0210861 A1Staker Scientific, Inc.
Most cited
By later US patents
- Automated wafer defect inspection system and a process of performing such inspection187US 6,324,298 B1August Technology Corp. · 2001
- Automated wafer defect inspection system and a process of performing such inspection55US 6,937,753 B1August Technology Corp. · 2005
- Apparatus for inspecting the surface of materials51US 5,298,963 AMitsui Mining & Smelting Co., Ltd. · 1994
- Coating density analyzer and method using non-synchronous TDI camera43US 5,668,887 AEastman Kodak Company · 1997
- Apparatus and methods for inspecting tape lamination38US 7,889,907 B2The Boeing Company · 2011