G01N 2021/745
Control of temperature, heating, ashing
Official title: {Control of temperature, heating, ashing}
G01N2021/745 (Control of temperature, heating, ashing) appears on 12 US grants and 4 published applications in this corpus.
Search patents in G01N- Granted patents
- 12
- Published applications
- 4
- Assignees
- 7
- Inventors
- 31
- Latest grant
- 10 Mar 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1988 | 1 | 0 |
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 1 | 0 |
| 1992 | 2 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 2 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 1 | 0 |
| 2016 | 0 | 0 |
| 2017 | 1 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 1 | 0 |
| 2021 | 0 | 0 |
| 2022 | 0 | 1 |
| 2023 | 1 | 1 |
| 2024 | 0 | 0 |
| 2025 | 0 | 0 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Apparatus comprising infrared cameras and a temperature source and method for detecting cracks in samples by infrared radiation10 Mar 2026US 12,571,727 B2Infineon Technologies AG
- Method and device for compensating temperature gradient effects29 Aug 2023US 11,740,175 B2TDK Corporation
- Atomic absorption spectrophotometer4 Feb 2020US 10,552,965 B1Shimadzu Corporation
- Heated wafer carrier profiling16 May 2017US 9,653,340 B2Veeco Instruments Inc.
- Heated wafer carrier profiling17 Feb 2015US 8,958,061 B2Veeco Instruments Inc.
- Apparatus and method for detecting cracks in samples by infrared radiation23 Mar 2023US 2023/0086591 A1Infineon Technologies AG
- Method and Device for Compensating Temperature Gradient Effects21 Apr 2022US 2022/0120666 A1TDK Corporation
- Heated wafer carrier profiling6 Dec 2012US 2012/0304926 A1Veeco Instruments Inc.
- Heated wafer carrier profiling6 Dec 2012US 2012/0307233 A1Veeco Instruments Inc.
Most cited
By later US patents
- Temperature control method using empirically determined characteristics18US 5,703,342 ABodenseewerk Perkin-Elmer & Co., GmbH · 1997
- Device for pyrometric temperature measurement6US 4,730,940 AGruen Analysengeraete GmbH · 1988
- Heated wafer carrier profiling5US 9,653,340 B2Veeco Instruments Inc. · 2017
- Atomic absorption spectrophotometer3US 4,890,919 AHitachi, Ltd. · 1990
- Atomic absorption spectrometer3US 4,989,975 A1991