G01N 2021/4723
Scanning scatter angles
Official title: {Scanning scatter angles}
G01N2021/4723 (Scanning scatter angles) appears on 13 US grants and 18 published applications in this corpus.
Search patents in G01N- Granted patents
- 13
- Published applications
- 18
- Assignees
- 17
- Inventors
- 41
- Latest grant
- 22 Oct 2024
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 2 |
| 2005 | 1 | 0 |
| 2006 | 1 | 2 |
| 2007 | 2 | 1 |
| 2008 | 1 | 1 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 1 |
| 2015 | 0 | 1 |
| 2016 | 0 | 1 |
| 2017 | 1 | 1 |
| 2018 | 0 | 1 |
| 2019 | 2 | 0 |
| 2020 | 2 | 1 |
| 2021 | 0 | 1 |
| 2022 | 1 | 3 |
| 2023 | 0 | 0 |
| 2024 | 1 | 0 |
| 2025 | 0 | 1 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Surface characteristics evaluation method, surface characteristics evaluation apparatus, and surface characteristics evaluation program22 Oct 2024US 12,125,220 B2Ricoh Company, Ltd.
- Method and system for in-line optical scatterometry10 May 2022US 11,327,012 B2
- Method and apparatus for detecting an object with circular-arc-shaped supporting elements29 Dec 2020US 10,880,538 B2Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e. V.
- Systems and methods for measuring reflectivity of a painted object11 Aug 2020US 10,739,259 B2Axalta Coating Systems IP Co., LLC
- Early warning of changes in health and robustness using narrowly forward scattered light to track ease of morphological changes of blood cells29 Oct 2019US 10,458,976 B2Satish DESHPANDE
- Universal gemstone cut identification device and method18 Jun 2026US 2026/0168935 A1Max Planck Postech/Korea Research Initiative
- Image-sensor-based scattering measurement system and method1 May 2025US 2025/0137927 A1Meta Platforms Technologies, LLC
- Method and apparatus for particle detection in turbid or clear medium3 Nov 2022US 2022/0349803 A1Soreq Nuclear Research Center
- Surface characteristics evaluation method, surface characteristics evaluation apparatus, and surface characteristics evaluation program18 Aug 2022US 2022/0262019 A1Ricoh Company, Ltd.
- Marble-color molded product and marble color effect evaluation system23 Jun 2022US 2022/0193968 A1LG Chem.Ltd.
Most cited
By later US patents
- Optical attachment for variable angle reflection spectroscopy22US 5,048,970 A1991
- Method of measuring a physical function using a composite function which includes the physical function and an arbitrary reference function7US 6,856,393 B2The Board of Trustees of the Leland Stanford University · 2005
- Method and device for the contactless assessment of the surface quality of a wafer4US 10,180,316 B2Brodmann Technologies GmbH · 2019
- Method of measuring a physical function using a composite function which includes the physical function and an arbitrary reference function4US 7,236,247 B2The Board of Trustees of the Leland Stanford Junior University · 2007
- Method of measuring a physical function using a composite function which includes the physical function and an arbitrary reference function3US 7,050,169 B2The Board of Trustees of the Leland Stanford Junior University · 2006