Optical attachment for variable angle reflection spectroscopy
AssigneeNicolas J. Harrick
InventorsMilan Milosevic, Nicolas J. Harrick
Life of this patent
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Abstract
A vaariable angle reflection accessory for use in reflection spectrometry characterized by a pair of fixed ellipsoidal reflectors positioned over the sample surface and a pair of rotatable plane mirrors positions at opposite sides of the sample surface. The spectrometer beam is brought to a focus at the first plane mirror, from which it is reflected off the first ellipsoidal reflector to a focus at the sample surface. The reflected beam follows a corresponding path back to the spectrometer. Rotating the mirrors in unison causes the beam angle of incidence on the sample surface to vary over a wide range while maintaining optical alignments and continuing to center the radiation on the same sample area.
Claims16
A variable angle reflection accessory for use in reflection spectrometry, comprising:
- means for supporting a sample having a surface to receive a radiation beam,
- first and second ellipsoidal segment reflectors mounted over the sample surface and in positions at first and second sides of the sample surface such that each ellipsoidal segment defines a first focus substantially at the sample surface and a second focus at, respectively, the first and second sides,
- first and second plane reflectors positioned, respectively, at the first and second sides with its reflecting surface at the location, respectively, of the second focus,
- optical means for directing a converging beam of radiation to the first plane reflector and for directing a diverging radiation beam from the second plane reflector,
- means for rotating the first and second plane reflectors in unison thereby to change the angle of incidence of the radiation beam on the sample surface.
A variable angle reflection accessory for use in reflection spectrometry, comprising:
- a support member,
- means for mounting on the support member a sample holder for a sample having a surface to reflect a radiation beam,
- first and second ellipsoidal segment reflectors fixedly mounted on the support member over the sample surface and in positions at the left and right sides of the sample surface such that each ellipsoidal segment defines a first focus substantially at the sample surface and a second focus at, respectively, the left and right sides of the sample surface,
- first and second plane reflectors on the support member and positioned, respectively, at the left and right sides each with its reflecting surface at the location, respectively, of the second focus of the first and second ellipsoidal reflectors,
- optical means for directing a converging beam of radiation from a spectrometer to a focus at the first plane reflector and for directing a diverging radiation beam from the second plane reflector back to the spectrometer,
- means for rotating the first and second plane reflectors in unison but in opposite directions so as to cause the radiation beam incident on the first plane reflector to scan across the surface of the first ellipsoidal segment whereby the beam reflected from the latter is incident on the sample surface at an angle of incidence that varies with the degree of rotation of the first plane reflector.
Dependencies are inferred from the claim text.