G01N 2015/139
Measuring the ratio of ac/dc impedances
Official title: {Measuring the ratio of AC/DC impedances}
G01N2015/139 (Measuring the ratio of ac/dc impedances) appears on 13 US grants and 5 published applications in this corpus.
Search patents in G01N- Granted patents
- 13
- Published applications
- 5
- Assignees
- 9
- Inventors
- 42
- Latest grant
- 13 Mar 2018
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| 2011 | 1 | 0 |
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| 2018 | 1 | 0 |
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| 2021 | 0 | 0 |
| 2022 | 0 | 0 |
| 2023 | 0 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Microparticle analysis apparatus and microparticle analysis system13 Mar 2018US 9,915,599 B2Sony Corporation
- Shape parameter for hematology instruments16 Aug 2011US 8,000,940 B2Beckman Coulter, Inc.
- Method and apparatus for performing platelet measurement24 Jun 2008US 7,390,662 B2Beckman Coulter, Inc.
- Microfabricated AC impedance sensor20 Aug 2002US 6,437,551 B1The Regents of the University of California
- Apparatus and method for analyzing particles30 Jul 2002US 6,426,615 B1
- Object identification method and object identification apparatus17 Aug 2023US 2023/0258549 A1Denso Corporation
- Microparticle analysis apparatus and microparticle analysis system31 Dec 2015US 2015/0377763 A1Sony Corporation
- Multi-frequency impedance method and apparatus for discriminating and counting particles expressing a specific marker7 Jun 2012US 2012/0142032 A1Koninklijke Philips Electronics N. V.
- Shape Parameter For Hematology Instruments8 Apr 2010US 2010/0088066 A1Beckman Coulter, Inc.
- Method and apparatus for performing platelet measurement10 May 2007US 2007/0105231 A1Beckman Coulter, Inc.
Most cited
By later US patents
- Method and apparatus for analyzing cells in a whole blood sample169US 6,228,652 B1Coulter International Corp. · 2001
- Multi-part differential analyzing apparatus utilizing light scatter techniques165US 5,125,737 ACoulter Electronics, Inc. · 1992
- Apparatus and method for analyzing particles143US 6,122,599 A2000
- Microfabricated AC impedance sensor137US 6,437,551 B1The Regents of the University of California · 2002
- Apparatus and method for analyzing particles52US 6,426,615 B12002