G01J 5/532
Using a reference heater of the emissive surface type
Official title: {using a reference heater of the emissive surface type, e.g. for selectively absorbing materials}
G01J5/532 (Using a reference heater of the emissive surface type) appears on 53 US grants and 44 published applications in this corpus.
Search patents in G01J- Granted patents
- 53
- Published applications
- 44
- Assignees
- 44
- Inventors
- 110
- Latest grant
- 18 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 3 | 0 |
| 1990 | 2 | 0 |
| 1991 | 1 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 1 | 0 |
| 1997 | 2 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 2 | 0 |
| 2003 | 1 | 0 |
| 2004 | 1 | 1 |
| 2005 | 0 | 0 |
| 2006 | 1 | 1 |
| 2007 | 0 | 3 |
| 2008 | 1 | 1 |
| 2009 | 2 | 1 |
| 2010 | 2 | 3 |
| 2011 | 1 | 0 |
| 2012 | 2 | 1 |
| 2013 | 0 | 3 |
| 2014 | 1 | 0 |
| 2015 | 2 | 1 |
| 2016 | 1 | 2 |
| 2017 | 2 | 2 |
| 2018 | 2 | 3 |
| 2019 | 1 | 2 |
| 2020 | 1 | 3 |
| 2021 | 2 | 2 |
| 2022 | 3 | 8 |
| 2023 | 2 | 0 |
| 2024 | 6 | 4 |
| 2025 | 1 | 1 |
| 2026 | 2 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
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- Optical transitional switch5 Mar 2026US 2026/0063378 A1Raytheon Company
- Reference wafer for high fidelity in-situ temperature metrology calibration22 Jan 2026US 2026/0022972 A1Lam Research Corporation
- Method and system for measurement of nonthermal far-infrared radiation9 Oct 2025US 2025/0314531 A1
- Cost effective, mass producible temperature controlled thermal imaging calibration source31 Oct 2024US 2024/0361191 A1Seek Thermal, Inc.
- Design, test, and operation of a small thermal imaging core18 Jul 2024US 2024/0240988 A1Seek Thermal, Inc.
Most cited
By later US patents
- Infrared electronic thermometer and method for measuring temperature209US 4,797,840 AThermoscan Inc. · 1989
- Apparatus and method for temperature measurement by radiation89US 5,127,742 AThermoscan Inc. · 1992
- Infrared radiation sources, sensors and source combinations, and methods of manufacture73US 7,119,337 B1Ion Optics, Inc. · 2006
- Method for measuring surface temperature of semiconductor wafer substrate, and heat-treating apparatus72US 4,979,134 AMinolta Camera Kabushiki Kaisha · 1990
- Pyrometer #249US 4,647,774 AQuantum Logic Corporation · 1987