Method and system for measurement of nonthermal far-infrared radiation
OwnerAlbert Chin-Tang WEYinventor
Life of this patent
Estimating the term…
Abstract
The present invention relates to a method and system for measuring the radiant power and emissivity of nonthermal far-infrared (FIR) radiation emitted from the surface of an FIR-photon-emitting specimen, specifically within the 3-16 μm wavelength range. This method and system include at least a test specimen, a reference material, an infrared imaging device, and a processing apparatus configured to execute a set of instructions. These instructions facilitate operations such as capturing thermal images of the test specimen and reference material, computing their grayscale values, and generating results that reveal the radiant power and emissivity of the test specimen, characteristics that would otherwise remain undetectable and imperceptible.
Claims20
A method for measuring nonthermal far-infrared radiation emitting from the surface of a specimen comprising:
- a) providing a test specimen;
- b) providing a reference material;
- c) providing an infrared imaging device to capture thermal images of the test specimen and reference material
- d) positioning the reference material and test specimen such that the test specimen and reference material generate thermal image data which is intercepted by the infrared imaging device;
- e) providing a processing apparatus to perform operations, including acquiring, computing, and displaying said thermal image data;
- wherein steps a) through e) produce results that can be used to quantify a radiant power and an emissivity of the nonthermal far-infrared radiation emitted by the test specimen.
A system for measuring nonthermal far-infrared radiation emitting from the surface of a test specimen comprising:
- a) a reference material,
- b) an infrared imaging device, and
- d) a processing apparatus configured to execute a set of instructions for performing operations, including capturing thermal images of the test specimen and reference material, computing the gray values for both, and producing results that can be used to quantify the radiant power and emissivity of the nonthermal far-infrared radiation emitted by the test specimen.
Dependencies are inferred from the claim text.