G01J 1/0223
Sample holders for photometry
Official title: {Sample holders for photometry}
G01J1/0223 (Sample holders for photometry) appears on 32 US grants and 39 published applications in this corpus.
Search patents in G01J- Granted patents
- 32
- Published applications
- 39
- Assignees
- 39
- Inventors
- 124
- Latest grant
- 5 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 1 | 0 |
| 2005 | 0 | 1 |
| 2006 | 1 | 0 |
| 2007 | 0 | 2 |
| 2008 | 1 | 2 |
| 2009 | 0 | 1 |
| 2010 | 1 | 2 |
| 2011 | 0 | 1 |
| 2012 | 2 | 0 |
| 2013 | 0 | 2 |
| 2014 | 1 | 1 |
| 2015 | 2 | 5 |
| 2016 | 1 | 5 |
| 2017 | 4 | 2 |
| 2018 | 0 | 2 |
| 2019 | 2 | 1 |
| 2020 | 4 | 1 |
| 2021 | 2 | 2 |
| 2022 | 1 | 3 |
| 2023 | 1 | 1 |
| 2024 | 3 | 2 |
| 2025 | 2 | 2 |
| 2026 | 1 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Ion beam time of arrival (TOA) gauge5 May 2026US 12,618,709 B2Analex Corporation
- Ion surface trap, and method for operating an ion surface trap30 Dec 2025US 12,512,231 B2Bundesrepublik Deutschland, Vertreten Durch Das Bundesministerium FüR Wirtsch
- Space-based imaging device and method of manufacture thereof18 Nov 2025US 12,473,101 B2The Johns Hopkins University
- Automatic analyzing apparatus and jig30 Apr 2024US 11,971,295 B2Canon Medical Systems Corporation
- Handheld luminometer and front end platform assembly19 Mar 2024US 11,933,665 B1Charm Sciences, Inc.
- Semiconductor testing structure23 Jul 2026US 2026/0210758 A1Ennostar Corporation
- Ion beam time of arrival (toa) gauge24 Jul 2025US 2025/0237546 A1Analex Corporation
- Ion surface trap, and method for operating an ion surface trap17 Apr 2025US 2025/0125064 A1Bundesrepublik Deutschland, Vertreten Durch Das Bundesministerium FüR Wirtschaft Und Energie
- Cuvette for a photometric measurement of a sample, method for a photometric measurement of a sample, system for a photometric analysis of a sample and method for a photometric analysis of a sample26 Dec 2024US 2024/0426743 A1Hach Lange GmbH
- Space-based imaging device and method of manufacture thereof11 Jan 2024US 2024/0010365 A1The Johns Hopkins University
Most cited
By later US patents
- Integrating sphere power meter18US 5,251,004 APDT Systems, Inc. · 1993
- Quick attachment fixture and power card for diode-based light devices18US 7,030,642 B2Honeywell International Inc. · 2006
- Vapor cells for imaging of electromagnetic fields8US 11,112,298 B2Quantum Valley Ideas Laboratories · 2021
- System and method for testing light-emitting devices8US 7,804,589 B2Chroma Ate Inc. · 2010
- Tomographic scanning apparatus6US 9,200,948 B2Institute of Nuclear Energy Research Atomic Energy Council, Executive Yuan · 2015