G01B 9/023
For contour producing
Official title: for contour producing (G01B9/025 - G01B9/029 take precedence)
G01B9/023 (For contour producing) appears on 13 US grants and 12 published applications in this corpus.
Search patents in G01B- Granted patents
- 13
- Published applications
- 12
- Assignees
- 11
- Inventors
- 34
- Latest grant
- 14 Apr 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 1 |
| 2003 | 0 | 0 |
| 2004 | 1 | 0 |
| 2005 | 0 | 1 |
| 2006 | 1 | 3 |
| 2007 | 0 | 1 |
| 2008 | 2 | 0 |
| 2009 | 1 | 0 |
| 2010 | 1 | 1 |
| 2011 | 1 | 1 |
| 2012 | 0 | 0 |
| 2013 | 1 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 1 |
| 2016 | 1 | 0 |
| 2017 | 0 | 1 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 0 | 0 |
| 2021 | 1 | 1 |
| 2022 | 1 | 0 |
| 2023 | 0 | 1 |
| 2024 | 0 | 0 |
| 2025 | 0 | 0 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Three-dimensional measurement device14 Apr 2026US 12,601,587 B2Ckd Corporation
- Hybrid 3D inspection system26 Apr 2022US 11,313,794 B2Orbotech Ltd.
- Manufacturing system25 May 2021US 11,014,212 B2Broetje-Automation GmbH
- Three-dimensional shape measuring device, method for acquiring hologram image, and method for measuring three-dimensional shape15 Nov 2016US 9,494,411 B23Dragons, LLC
- Interferometric system with spatial carrier frequency capable of imaging in polychromatic radiation3 Sep 2013US 8,526,003 B2Vysoke Uceni Technicke Brne
- Three-dimensional measurement device29 Jun 2023US 2023/0204345 A1Ckd Corporation
- Hybrid 3D Inspection System8 Apr 2021US 2021/0102892 A1Orbotech Ltd.
- Manufacturing system1 Jun 2017US 2017/0151643 A1Broetje-Automation GmbH
- Three-Dimensional Shape Measuring Device, Method for Acquiring Hologram Image, and Method for Measuring Three-Dimensional Shape22 Oct 2015US 2015/0300803 A13Dragons, LLC
- Interferometric system with spatial carrier frequency capable of imaging in polychromatic radiation20 Oct 2011US 2011/0255093 A1Vysoke Uceni Technicke V Brne
Most cited
By later US patents
- Interferometer for determining characteristics of an object surface, including processing and calibration61US 7,428,057 B2Zygo Corporation · 2008
- Interferometer for determining characteristics of an object surface32US 7,446,882 B2Zygo Corporation · 2008
- Interferometer with multiple modes of operation for determining characteristics of an object surface23US 7,616,323 B2Zygo Corporation · 2009
- Process and device for determining three-dimensional structure in the submicron range6US 5,910,660 AHeinz Paul Weber · 1999
- Light interference measurement method using computer-generated hologram, and interferometer using this method4US 7,145,659 B2Fujinon Corporation · 2006