G01B 9/02021
Contacting different faces of object
Official title: {contacting different faces of object, e.g. opposite faces}
G01B9/02021 (Contacting different faces of object) appears on 202 US grants and 182 published applications in this corpus.
Search patents in G01B- Granted patents
- 202
- Published applications
- 182
- Assignees
- 109
- Inventors
- 427
- Latest grant
- 2 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 2 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 2 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 2 | 0 |
| 1991 | 1 | 0 |
| 1992 | 3 | 0 |
| 1993 | 0 | 0 |
| 1994 | 2 | 0 |
| 1995 | 4 | 0 |
| 1996 | 3 | 0 |
| 1997 | 3 | 0 |
| 1998 | 7 | 0 |
| 1999 | 4 | 0 |
| 2000 | 6 | 0 |
| 2001 | 1 | 1 |
| 2002 | 4 | 4 |
| 2003 | 4 | 11 |
| 2004 | 5 | 8 |
| 2005 | 8 | 5 |
| 2006 | 7 | 16 |
| 2007 | 7 | 8 |
| 2008 | 13 | 6 |
| 2009 | 12 | 5 |
| 2010 | 3 | 7 |
| 2011 | 4 | 6 |
| 2012 | 0 | 9 |
| 2013 | 3 | 3 |
| 2014 | 11 | 9 |
| 2015 | 6 | 14 |
| 2016 | 6 | 12 |
| 2017 | 8 | 4 |
| 2018 | 12 | 10 |
| 2019 | 10 | 7 |
| 2020 | 14 | 12 |
| 2021 | 6 | 5 |
| 2022 | 4 | 3 |
| 2023 | 2 | 2 |
| 2024 | 0 | 8 |
| 2025 | 8 | 3 |
| 2026 | 3 | 4 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
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- Acquiring apparatus, acquiring method, and optical system manufacturing method30 Dec 2025US 12,510,348 B2Canon Kabushiki Kaisha
- Hybrid displacement measuring device19 Aug 2025US 12,392,599 B1Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences
- Device for performing optical coherence tomography27 Aug 2026US 2026/0248381 A1Heidelberg Engineering GmbH
- Position measurement method and device18 Jun 2026US 2026/0168822 A1Brightest Technology Taiwan Co., Ltd.
- Systems and methods for quasi-doppler shift interferometer15 Jan 2026US 2026/0017781 A1
- Measuring module for determining the position of a component in an optical system for microlithography8 Jan 2026US 2026/0010080 A1
- Position detection system using laser light interferometry25 Sep 2025US 2025/0297851 A1Vdl Enabling Technologies Group B.V.
Most cited
By later US patents
- Differential interferometer system and lithographic step-and-scan apparatus provided with such a system426US 6,046,792 AU. S. Philips Corporation · 2000
- Method and device for measuring the optical properties of at least two regions located at a distance from one another in a transparent and/or diffuse object195US 6,806,963 B1Haag-Streit AG · 2004
- Method and apparatus for measuring substrate layer thickness during chemical mechanical polishing180US 6,159,073 AAPPLIED Materials.Inc. · 2000
- Frequency transform phase shifting interferometry141US 6,882,432 B2Zygo Corporation · 2005
- Method of and apparatus for measuring coordinate position and positioning an object86US 5,151,749 ANikon Corporation · 1992