G01B 5/20
Measuring arrangements characterised by the use of mechanical techniques: for measuring contours
Official title: for measuring contours or curvatures
G01B5/20 (Measuring arrangements characterised by the use of mechanical techniques: for measuring contours) appears on 903 US grants and 643 published applications in this corpus.
Search patents in G01B- Granted patents
- 903
- Published applications
- 643
- Assignees
- 479
- Inventors
- 1,714
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 10 | 0 |
| 1977 | 7 | 0 |
| 1978 | 10 | 0 |
| 1979 | 11 | 0 |
| 1980 | 17 | 0 |
| 1981 | 9 | 0 |
| 1982 | 19 | 0 |
| 1983 | 17 | 0 |
| 1984 | 9 | 0 |
| 1985 | 24 | 0 |
| 1986 | 23 | 0 |
| 1987 | 12 | 0 |
| 1988 | 10 | 0 |
| 1989 | 14 | 0 |
| 1990 | 21 | 0 |
| 1991 | 14 | 0 |
| 1992 | 19 | 0 |
| 1993 | 10 | 0 |
| 1994 | 9 | 0 |
| 1995 | 8 | 0 |
| 1996 | 8 | 0 |
| 1997 | 4 | 0 |
| 1998 | 9 | 0 |
| 1999 | 9 | 0 |
| 2000 | 10 | 0 |
| 2001 | 13 | 2 |
| 2002 | 9 | 17 |
| 2003 | 20 | 8 |
| 2004 | 13 | 19 |
| 2005 | 17 | 21 |
| 2006 | 15 | 9 |
| 2007 | 7 | 16 |
| 2008 | 16 | 19 |
| 2009 | 17 | 42 |
| 2010 | 29 | 26 |
| 2011 | 20 | 22 |
| 2012 | 22 | 17 |
| 2013 | 16 | 16 |
| 2014 | 17 | 44 |
| 2015 | 30 | 36 |
| 2016 | 44 | 27 |
| 2017 | 34 | 33 |
| 2018 | 25 | 26 |
| 2019 | 32 | 54 |
| 2020 | 34 | 46 |
| 2021 | 38 | 33 |
| 2022 | 32 | 28 |
| 2023 | 36 | 25 |
| 2024 | 18 | 20 |
| 2025 | 20 | 22 |
| 2026 | 16 | 15 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Checking the dimensional accuracy of a workpiece with a switching touch probe29 Sep 2026US 12,747,939 B2Siemens Aktiengesellschaft
- Structure for detection of the number of items in an electrical connector1 Sep 2026US 12,725,975 B2Yazaki Corporation
- Method and system for testing the roundness of the inner wall of a pipe or other hollow cylinder18 Aug 2026US 12,710,260 B2Insulation Technology Corporation
- Methods for compensating for crystal structure differential material removal rates in sub-aperture figuring processes28 Jul 2026US 12,691,548 B2Corning Incorporated
- Automatic measuring systems and control method for automatic measuring systems14 Jul 2026US 12,682,495 B2Mitutoyo Corporation
- Measuring system for determining shape, deformations and/or changes in orientation of a measurement object24 Sep 2026US 2026/0287318 A1Airbus Operations GmbH
- Method for measuring flatness deviations and curvature directions of components in a punching machine3 Sep 2026US 2026/0259030 A1TRUMPF Werkzeugmaschinen GmbH + Co. KG
- Polishing device13 Aug 2026US 2026/0233358 A1Ebara Corporation
- Methods and apparatus to measure hole normality6 Aug 2026US 2026/0227169 A1The Boeing Company
- Measuring head, and rocking fulcrum member used therein25 Jun 2026US 2026/0177126 A1Tokyo Seimitsu Co., Ltd.
Most cited
By later US patents
- Apparatus and method for determining contour characteristics of a contoured article153US 4,679,331 APPG Industries, Inc. · 1987
- Method and apparatus for bone size gauging124US 4,987,904 A1991
- Method of gaging and joining pipe98US 4,127,927 A1978
- Generative measuring system73US 5,505,003 AM&M Precision Systems Corporation · 1996
- Systems and methods for mapping and marking the thickness of bioprosthetic sheet69US 6,378,221 B1Edwards Lifesciences Corporation · 2002