G01B 21/20
Measuring arrangements or details thereof, where the measuring technique is not covered
Official title: for measuring contours or curvatures, e.g. determining profile
G01B21/20 (Measuring arrangements or details thereof, where the measuring technique is not covered) appears on 424 US grants and 472 published applications in this corpus.
Search patents in G01B- Granted patents
- 424
- Published applications
- 472
- Assignees
- 326
- Inventors
- 1,119
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 2 | 0 |
| 1980 | 4 | 0 |
| 1981 | 2 | 0 |
| 1982 | 1 | 0 |
| 1983 | 2 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 4 | 0 |
| 1987 | 1 | 0 |
| 1988 | 1 | 0 |
| 1989 | 2 | 0 |
| 1990 | 2 | 0 |
| 1991 | 2 | 0 |
| 1992 | 1 | 0 |
| 1993 | 1 | 0 |
| 1994 | 2 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 1 | 0 |
| 1998 | 3 | 0 |
| 1999 | 4 | 0 |
| 2000 | 3 | 0 |
| 2001 | 5 | 2 |
| 2002 | 3 | 7 |
| 2003 | 12 | 5 |
| 2004 | 4 | 3 |
| 2005 | 3 | 10 |
| 2006 | 4 | 3 |
| 2007 | 8 | 11 |
| 2008 | 7 | 9 |
| 2009 | 10 | 18 |
| 2010 | 9 | 10 |
| 2011 | 9 | 9 |
| 2012 | 9 | 22 |
| 2013 | 6 | 15 |
| 2014 | 10 | 33 |
| 2015 | 18 | 24 |
| 2016 | 25 | 20 |
| 2017 | 26 | 36 |
| 2018 | 19 | 33 |
| 2019 | 34 | 44 |
| 2020 | 34 | 24 |
| 2021 | 32 | 28 |
| 2022 | 23 | 25 |
| 2023 | 17 | 20 |
| 2024 | 26 | 24 |
| 2025 | 19 | 23 |
| 2026 | 10 | 14 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method for grinding a workpiece with a toothing or a profile6 Oct 2026US 12,752,356 B2Kapp Niles GmbH & Co. KG
- Wafer support for measuring wafer geometry15 Sep 2026US 12,740,368 B2Tokyo Electron Limited
- Method for straightening bar-shaped material and a straightening machine1 Sep 2026US 12,722,194 B2Rattunde AG
- Method for determining a shape of a mistuned blade of an impeller of a turbomachine25 Aug 2026US 12,716,718 B2Rolls-Royce Deutschland Ltd & Co KG
- Apparatus and method for measuring shape of underwater tow cables14 Jul 2026US 12,680,811 B1The United States of America as represented by the Secretary of the Navy
- Apparatus and method for measuring battery cell profile10 Sep 2026US 2026/0266601 A1Samsung SDI.Co., Ltd.
- Inspection assistance device and inspection assistance method10 Sep 2026US 2026/0266602 A1Hitachi, Ltd.
- Method to automatically position blanks in a strip and to calculate the associated scrap ratio3 Sep 2026US 2026/0259050 A1
- Systems and methods for tactile intelligence30 Jul 2026US 2026/0216890 A1GelSight, Inc.
- Methods for measuring inner profile of thin-walled composite tubular component with large length-to-diameter ratio23 Jul 2026US 2026/0210707 A1Chengdu Aircraft Industrial (Group) Co., Ltd.
Most cited
By later US patents
- Elastic sensor mesh system for 3-dimensional measurement, mapping and kinematics applications375US 6,640,202 B1International Business Machines Corporation · 2003
- Method and apparatus for recording three-dimensional topographies140US 5,771,310 AShriners Hospitals for Children · 1998
- Probable reconstruction of surfaces in occluded regions by computed symmetry116US 7,961,934 B2Strider Labs, Inc. · 2011
- Edge detector101US 5,304,924 ACanon Kabushiki Kaisha · 1994
- Apparatus for measuring the profile of a railroad tunnel69US 4,179,216 AFranz Plasser Bahnbaumaschinen-Industriegesellschaft m. b. H. · 1979