Inspection assistance device and inspection assistance method
AssigneeHitachi, Ltd.
InventorsMasahiro WATANABE, Tatsuo HARIYAMA, Kenji MARUNO, Tetsuya TOYOUCHI
Life of this patent
Estimating the term…
Loading patent…
AssigneeHitachi, Ltd.
InventorsMasahiro WATANABE, Tatsuo HARIYAMA, Kenji MARUNO, Tetsuya TOYOUCHI
Estimating the term…
An operator is enabled to inspect a workpiece using an inspection assistance device configured to acquire real data indicating a shape, a position, and an orientation of a workpiece placed in a real space, and configured to calculate an inspection position on the workpiece in the real space by performing a conversion operation of superimposing design data indicating a design shape of the workpiece on the real data on an inspection position on the design data. A sensor position acquisition unit is acquires a position of a sensor that inspects the workpiece in the real space, and a display control unit causes a display device to display a direction in which a difference between the inspection position on the workpiece in the real space and the position of the sensor falls within an allowable positional deviation range as a direction in which the sensor is to be moved.
An inspection assistance device comprising:
An inspection assistance method in which a computer executes:
Dependencies are inferred from the claim text.