Phase Shift Technology, Inc.
Tucson, AZ, US· latest recorded location
Phase Shift Technology, Inc. is named on 7 US grants and 0 published applications in this corpus. Its most frequent classification is G01B (Measuring length, thickness or similar linear dimensions).
- Granted patents
- 7
- Published applications
- 0
- Inventors
- 6
- Granted in 2026 so far
- 0
- Most recent grant
- 26 Apr 2005
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 4 | 0 |
By publication year.
Technology areas
Share of 7 documents
Recent patents
- Weighted least-square interferometric measurement of multiple surfaces26 Apr 2005US 6,885,461 B2
- Non linear phase shift calibration for interferometric measurement of multiple surfaces15 Feb 2005US 6,856,405 B2
- Method and apparatus for measuring the shape and thickness variation of polished opaque plates25 Jan 2005US 6,847,458 B2
- Apparatus and method for holding and transporting thin opaque plates18 Jan 2005US 6,844,929 B2
- Interferometer light source9 May 2000US 6,061,133 A
No published applications.
Most cited
By later US patents
- Method and apparatus for measuring the shape and thickness variation of polished opaque plates54US 6,847,458 B22005
- Sheet flatness measurement system and method19US 5,471,307 A1995
- Interferometer light source17US 6,061,133 A2000
- Extended-source low coherence interferometer for flatness testing9US 5,737,081 A1998
- Non linear phase shift calibration for interferometric measurement of multiple surfaces5US 6,856,405 B22005