Phase Shift Technology, Inc.
Phase Shift Technology, Inc. is named on 0 US grants and 6 published applications in this corpus. Its most frequent classification is G01B (Measuring length, thickness or similar linear dimensions).
- Granted patents
- 0
- Published applications
- 6
- Inventors
- 7
- Granted in 2026 so far
- 0
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2004 | 0 | 4 |
| 2005 | 0 | 0 |
| 2006 | 0 | 1 |
| 2007 | 0 | 1 |
By publication year.
Technology areas
Share of 6 documents
Recent patents
No granted patents yet.
- Measurement of the top surface of an object with/without transparent thin films in white light interferometry11 Jan 2007US 2007/0008551 A1
- Compliant pad wafer chuck16 Nov 2006US 2006/0255819 A1
- Apparatus and method for holding and transporting thin opaque plates14 Oct 2004US 2004/0201843 A1
- Method and apparatus for measuring the shape and thickness variation of polished opaque plates23 Sep 2004US 2004/0184038 A1
- Non linear phase shift calibration for interferometric measurement of multiple surfaces9 Sep 2004US 2004/0174526 A1
Most cited
By later US patents
None of its patents has been cited by a later US patent yet.