Method of fabricating semiconductor device
AssigneeVanguard International Semiconductor Corporation
InventorsChi-Hua Yu, Shih-Tsung Kung, Wen-Chun Chung, Yi-Hong Hong
Life of this patent
Estimating the term…
Loading patent…
AssigneeVanguard International Semiconductor Corporation
InventorsChi-Hua Yu, Shih-Tsung Kung, Wen-Chun Chung, Yi-Hong Hong
Estimating the term…
A method for fabricating a semiconductor device is provided and includes the following steps: providing a substrate; forming a lower electrode on the substrate; forming at least one sub-dielectric layer on the lower electrode; patterning the dielectric layer to form an intermediate dielectric layer, where the intermediate dielectric layer exposes a portion of the at least one sub-dielectric layer; forming a hole by etching the portion of the at least one sub-dielectric layer not covered by the intermediate dielectric layer; filling at least one plug into the hole; and forming an upper electrode on the intermediate dielectric layer.
A method of fabricating a semiconductor device, comprising:
Dependencies are inferred from the claim text.