Chemical Mechanical Polishing (CMP) of Cobalt-Containing Substrate
AssigneeVersum Materials US, LLC
InventorsXiaobo Shi, James Allen Schlueter, Mark Leonard O'Neill
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AssigneeVersum Materials US, LLC
InventorsXiaobo Shi, James Allen Schlueter, Mark Leonard O'Neill
Estimating the term…
Chemical mechanical polishing (CMP) compositions, methods and systems for polish cobalt or cobalt-containing substrates are provided. Dual, or at least two chelators were used in the CMP polishing compositions as complexing agents for achieving the unique synergetic effects to afford high, tunable Co removal rates and with low static etch rates on Co film surface for the efficient Co corrosion protection during CMP process. The cobalt chemical mechanical polishing compositions also provide very high selectivity of Co film vs. other barrier layers, such as Ta, TaN, Ti, and TiN, and dielectric film, such as TEOS, SiNx, low-k, and ultra low-k films.
A chemical mechanical polishing (CMP) polishing composition for cobalt-containing substrate, consisting essentially of:
A chemical mechanical polishing (CMP) system comprising:
Dependencies are inferred from the claim text.