Integrated circuit protection and detection grid

A mesh of conductors forming a grid in a multi-layered electronic device comprising

• a first set of conductors disposed in one layer forming parallel lines in the one layer,
• a second set of conductors disposed in another layer forming parallel lines in the other layer,
• the first set of conductors configured to provide a first voltage reference, and the second set of conductors configured to provide a second voltage reference,
• at least one grid check circuit, coupled to the first set of conductors and the second set of conductors, for monitoring presence and/or absence of at least one of the first or second voltage references.

A method for integrity monitoring of a multi-layered electronic device, comprising the steps of:

• (a) distributing a first potential reference by way of one conducting layer of the electronic device;
• (b) distributing a second potential reference by way of another conducting layer of the electronic device;
• (c) distributing a first voltage reference, which is different from the first potential reference in the one conducting layer;
• (d) distributing a second voltage reference, which is different from the second potential reference in the other conducting layer;
• and
• (e) periodically monitoring the distribution of the first and second voltage references to determine the integrity of the multi-layered electronic device.