H04B 3/462

Testing group delay or phase shift

Official title: Testing group delay or phase shift, e.g. timing jitter

H04B3/462 (Testing group delay or phase shift) appears on 148 US grants and 128 published applications in this corpus.

Search patents in H04B
Granted patents
148
Published applications
128
Assignees
105
Inventors
282
Latest grant
24 Feb 2026

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H04B 3/462: granted patents and published applications per publication year
YearGranted patentsPublished applications
197630
197710
197800
197900
198010
198130
198200
198300
198400
198500
198600
198700
198800
198910
199010
199100
199200
199300
199400
199500
199630
199720
199830
199910
200000
200110
200210
200323
200411
200516
200615
200735
200833
200947
201063
201155
201287
201332
201459
2015148
20161011
20171310
201899
2019109
202066
202168
202280
202323
202405
202563
202610

By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.

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