H01J 49/466
Using crossed electric and magnetic fields perpendicular to the beam
Official title: {using crossed electric and magnetic fields perpendicular to the beam, e.g. Wien filter (see also H01J49/288)}
H01J49/466 (Using crossed electric and magnetic fields perpendicular to the beam) appears on 11 US grants and 3 published applications in this corpus.
Search patents in H01J- Granted patents
- 11
- Published applications
- 3
- Assignees
- 10
- Inventors
- 22
- Latest grant
- 24 Aug 2021
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 2 | 0 |
| 2003 | 1 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 1 |
| 2008 | 1 | 0 |
| 2009 | 1 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 0 | 1 |
| 2021 | 1 | 0 |
| 2022 | 0 | 0 |
| 2023 | 0 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Extraction system for charged secondary particles for use in a mass spectrometer or other charged particle device24 Aug 2021US 11,101,123 B2Luxembourg Institute of Science and Technology (List)
- High-resolution auger electron spectrometer14 Jul 2009US 7,560,691 B1KLA-Tencor Technologies Corporation
- Single stage charged particle beam energy width reduction system for charged particle beam system23 Dec 2008US 7,468,517 B2ICT Integrated Circuit Testing Gesellschaft fur Halbleiternruftechnik mbH
- Wien filter for use in a scanning electron microscope or the like15 Jul 2003US 6,593,578 B1Schlumberger Technologies, Inc.
- Wien filter17 Sep 2002US 6,452,169 B1Technische Universiteit Delft
- Filter stack for a thomson parabola spectrometer16 Mar 2023US 2023/0077828 A1Marvel Fusion GmbH
- Extraction System For Charged Secondary Particles For Use In A Mass Spectrometer Or Other Charged Particle Device20 Feb 2020US 2020/0058480 A1Luxembourg Institute of Science and Technology (List)
- Single stage charged particle beam energy width reduction system for charged particle beam system12 Jul 2007US 2007/0158561 A1ICT Integrated Circuit Testing Gesellschaft fur Halbleiternruftechnik mbH
Most cited
By later US patents
- Wien filter50US 4,019,989 AU. S. Philips Corporation · 1977
- Energy filtered focused ion beam column29US 6,410,924 B1Schlumberger Technologies, Inc. · 2002
- High-resolution auger electron spectrometer11US 7,560,691 B1KLA-Tencor Technologies Corporation · 2009
- Wien filter apparatus with hyperbolic surfaces10US 5,444,243 AHitachi, Ltd. · 1995
- Wien filter for use in a scanning electron microscope or the like9US 6,593,578 B1Schlumberger Technologies, Inc. · 2003