H01J 49/08
Electron sources
Official title: Electron sources, e.g. for generating photo-electrons, secondary electrons or Auger electrons
H01J49/08 (Electron sources) appears on 61 US grants and 55 published applications in this corpus.
Search patents in H01J- Granted patents
- 61
- Published applications
- 55
- Assignees
- 55
- Inventors
- 123
- Latest grant
- 18 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1984 | 1 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 2 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 3 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 1 | 0 |
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 1 | 0 |
| 2003 | 3 | 2 |
| 2004 | 0 | 0 |
| 2005 | 1 | 2 |
| 2006 | 1 | 0 |
| 2007 | 1 | 2 |
| 2008 | 0 | 1 |
| 2009 | 1 | 3 |
| 2010 | 1 | 2 |
| 2011 | 2 | 2 |
| 2012 | 2 | 0 |
| 2013 | 1 | 1 |
| 2014 | 0 | 4 |
| 2015 | 2 | 2 |
| 2016 | 5 | 1 |
| 2017 | 1 | 4 |
| 2018 | 4 | 7 |
| 2019 | 4 | 5 |
| 2020 | 4 | 6 |
| 2021 | 5 | 3 |
| 2022 | 2 | 0 |
| 2023 | 3 | 3 |
| 2024 | 1 | 4 |
| 2025 | 1 | 1 |
| 2026 | 2 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Magnet positioning system for ion source18 Aug 2026US 12,712,169 B2Thermo Finnigan LLC
- Angle-resolving photoelectron spectrometer and method20 Jan 2026US 12,529,664 B2Scienta Omicron AB
- Holding device for at least one filament and mass spectrometer15 Apr 2025US 12,278,100 B2Leybold Aktiengesellschaft
- Electron capture detector30 Apr 2024US 11,971,394 B2Sharp Kabushiki Kaisha
- 3D-printed field emission sources for compact systems17 Oct 2023US 11,791,121 B2Instituto Tecnologico Y De Estudios Superiores De Monterrey
- Electron Emitter for an Ion Reaction Device of a Mass Spectrometer and Methods of Operating the Same13 Mar 2025US 2025/0087474 A1DH Technologies Development Pte. Ltd.
- Internal Fragment Reduction in Top Down ECD Analysis of Proteins4 Jul 2024US 2024/0222103 A1DH Technologies Development Pte. Ltd.
- Collision Judgment Apparatus, Recording Medium Recording Program, and Collision Judgment Method27 Jun 2024US 2024/0212975 A1JEOL Ltd.
- Angle-resolving photoelectron spectrometer and method4 Apr 2024US 2024/0110882 A1Scienta Omicron AB
- Apparatus and method11 Jan 2024US 2024/0014022 A1
Most cited
By later US patents
- High dynamic range ion detector for mass spectrometers22US 9,899,201 B12018
- Electron spectroscopy system for chemical analysis of electrically isolated specimens21US 4,680,467 AKevex Corporation · 1987
- Ion mirror and ion-optical lens for imaging18US 10,636,646 B2Micromass UK Limited · 2020
- Method and apparatus for analyzing a gas sample14US 5,412,207 AMarquette Electronics, Inc. · 1995
- Photoelectron source for use in a gas chromatograph detector and mass spectrometer ion source13US 4,476,392 A1984