H01J 43/025
Circuits therefor
Official title: {Circuits therefor}
H01J43/025 (Circuits therefor) appears on 9 US grants and 10 published applications in this corpus.
Search patents in H01J- Granted patents
- 9
- Published applications
- 10
- Assignees
- 9
- Inventors
- 18
- Latest grant
- 18 Oct 2022
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2004 | 1 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 1 |
| 2008 | 1 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 2 |
| 2013 | 1 | 0 |
| 2014 | 0 | 1 |
| 2015 | 0 | 1 |
| 2016 | 1 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 1 | 3 |
| 2020 | 1 | 0 |
| 2021 | 2 | 1 |
| 2022 | 1 | 0 |
| 2023 | 0 | 0 |
| 2024 | 0 | 1 |
By publication year.
Recent patents
- Ion detection system18 Oct 2022US 11,476,104 B2Micromass UK Limited
- Ion detection system8 Jun 2021US 11,031,220 B2Micromass UK Limited
- Electron multipliers9 Feb 2021US 10,916,413 B2Adaptas Solutions Pty Ltd
- Electron multiplier for mass spectrometer7 Apr 2020US 10,615,019 B2Agilent Technologies, Inc.
- Mass spectrometer having multi-dynode multiplier(s) of high dynamic range operation5 Nov 2019US 10,468,239 B1
- Electron Multiplier Having Improved Voltage Stabilisation1 Aug 2024US 2024/0258089 A1
- Ion detection system21 Oct 2021US 2021/0327697 A1Micromass UK Limited
- Mass spectrometer having multi-dynode multiplier(s) of high dynamic range operation14 Nov 2019US 2019/0348265 A1
- Ion detection system19 Sep 2019US 2019/0287777 A1Micromass UK Limited
- Improvements in electron multipliers22 Aug 2019US 2019/0259590 A1Etp Ion Detect Pty Ltd
Most cited
By later US patents
- Method and system for gating a power supply in a radiation detector11US 6,690,098 B1Litton Systems, Inc. · 2004
- Mass spectrometer having multi-dynode multiplier(s) of high dynamic range operation3US 10,468,239 B12019
- Mass spectrometer3US 8,519,327 B2Shimadzu Corporation · 2013
- Electron multiplier for mass spectrometer1US 10,615,019 B2Agilent Technologies, Inc. · 2020
- Systems, circuits and methods for extending the detection range of an inspection system by avoiding circuit saturation1US 7,423,250 B2KLA-Tencor Technologies Corporation · 2008