Improvements in electron multipliers

A method for amplifying an electron signal caused by the impact of a particle with an electron emissive surface, the method comprising the steps of:

• providing an apparatus comprising:
• a first electron emissive surface configured to receive an input particle and thereby emit one or more secondary electrons,
• a series of second and subsequent electron emissive surfaces configured to form an amplified electron signal from the one or more secondary electrons emitted by the first electron emissive surface, and
• one or more power supplies configured to apply bias voltage(s) to one or more of the emissive surfaces, the bias voltage(s) being sufficient to form the amplified electron signal, wherein the apparatus is configured such that the terminal electron emissive surface(s) of the series of second and subsequent electron emissive surfaces draw a higher electrical current than that of the remainder electron emissive surface(s),
• causing or allowing a particle to impact the first electron emissive surface, and
• applying bias voltage(s) to one or more of the emissive surfaces, the bias voltage(s) being sufficient to form the amplified electron signal.

A method for amplifying an electron signal caused by the impact of a particle with an electron emissive surface, the method comprising the steps of:

• providing an apparatus comprising:
• a first electron emissive surface configured to receive an input particle and thereby emit one or more secondary electrons,
• a series of second and subsequent electron emissive surfaces configured to form an amplified electron signal from the one or more secondary electrons emitted by the first electron emissive surface, and
• one or more power supplies configured to apply bias voltage(s) to one or more of the emissive surfaces, the bias voltage(s) being sufficient to form the amplified electron signal, wherein the apparatus is configured such that the terminal electron emissive surface(s) of the series of second and subsequent electron emissive surfaces draw a higher electrical current than that of the remainder electron emissive surface(s),
• causing or allowing a particle to impact the first electron emissive surface, and
• applying the bias voltage of each power supply independently to (i) different electron emissive surfaces, and/or (ii) different groups of electron emissive surfaces, the difference(s) in bias voltages being sufficient such that the terminal electron emissive surface(s) of the series of second and subsequent electron emissive surfaces draw a higher electrical current than (a) that of the remainder electron emissive surface(s) of the series of second and subsequent electron emissive surfaces, and/or (b) the first emissive surface.