G07D 7/01

Testing electronic circuits therein

G07D7/01 (Testing electronic circuits therein) appears on 115 US grants and 133 published applications in this corpus.

Search patents in G07D
Granted patents
115
Published applications
133
Assignees
82
Inventors
254
Latest grant
3 Feb 2026

Filings by year

G07D 7/01: granted patents and published applications per publication year
YearGranted patentsPublished applications
197810
197900
198000
198100
198200
198300
198410
198500
198600
198700
198800
198900
199000
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199400
199510
199600
199700
199800
199900
200000
200110
200201
200324
2004114
2005311
200677
200776
2008311
2009812
2010612
201189
201265
201375
2014136
201572
201672
201727
201867
201954
202013
202151
202210
202323
202401
202530
202610

By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.