G06V 2201/122
Computational image acquisition in electron microscopy
G06V2201/122 (Computational image acquisition in electron microscopy) appears on 27 US grants and 31 published applications in this corpus.
Search patents in G06V- Granted patents
- 27
- Published applications
- 31
- Assignees
- 26
- Inventors
- 76
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2003 | 1 | 0 |
| 2004 | 0 | 2 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 1 | 0 |
| 2009 | 0 | 3 |
| 2010 | 0 | 1 |
| 2011 | 1 | 1 |
| 2012 | 1 | 0 |
| 2013 | 3 | 0 |
| 2014 | 0 | 1 |
| 2015 | 2 | 1 |
| 2016 | 0 | 3 |
| 2017 | 3 | 2 |
| 2018 | 2 | 3 |
| 2019 | 0 | 2 |
| 2020 | 2 | 2 |
| 2021 | 1 | 3 |
| 2022 | 4 | 2 |
| 2023 | 1 | 1 |
| 2024 | 2 | 3 |
| 2025 | 1 | 1 |
| 2026 | 2 | 0 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Method for automatically searching for at least one textile pattern in a composite material reinforcement22 Sep 2026US 12,743,897 B2Safran Aircraft Engines
- Build material handling unit for a powder module for an apparatus for additively manufacturing three-dimensional objects10 Mar 2026US 12,570,041 B2Concept Laser GmbH
- Scanning electron microscope device, semiconductor manufacturing device, and method of controlling semiconductor manufacturing device20 May 2025US 12,307,650 B2Samsung Electronics Co., Ltd.
- Image evaluation apparatus and image evaluation method24 Sep 2024US 12,100,133 B2Hitachi High-Tech Corporation
- Build material handling unit for a powder module for an apparatus for additively manufacturing three-dimensional objects23 Jan 2024US 11,878,463 B2Concept Laser GmbH
- Method, a computer program and a system for sperm quality determination3 Jul 2025US 2025/0213178 A1Fundació Institut De CièNcies FotòNiques
- Cell counting method, machine learning model construction method and recording medium23 May 2024US 2024/0169523 A1SCREEN Holdings Co., Ltd.
- Build material handling unit for a powder module for an apparatus for additively manufacturing three-dimensional objects25 Apr 2024US 2024/0131783 A1Concept Laser GmbH
- Method for automatically searching for at least one textile pattern in a composite material reinforcement4 Jan 2024US 2024/0005679 A1Safran Aircraft Engines
- Scanning electron microscope device, semiconductor manufacturing device, and method of controlling semiconductor manufacturing device9 Mar 2023US 2023/0074302 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Method for automatic alignment of tilt series in an electron microscope5US 7,463,791 B2FEI Company · 2008
- Structure determination system, structure determination method, and program4US 8,391,619 B2National Institute of Advanced Industrial Science and Technology · 2013
- Method and system for aligning and classifying images4US 9,064,188 B22015
- Device and method for microscopy on a plurality of samples4US 9,824,259 B2Karlsruher Institut Fuer Technologie · 2017
- Methods for use in three-dimensional structural determination3US 6,604,052 B1The Board of Trustee of the Leland Stanford Junior University · 2003