G05B 2219/37451
Plan sensor placement for optimal inspection
G05B2219/37451 (Plan sensor placement for optimal inspection) appears on 8 US grants and 8 published applications in this corpus.
Search patents in G05B- Granted patents
- 8
- Published applications
- 8
- Assignees
- 9
- Inventors
- 45
- Latest grant
- 31 Mar 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2005 | 1 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 1 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 1 | 1 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 1 |
| 2019 | 1 | 0 |
| 2020 | 0 | 0 |
| 2021 | 0 | 0 |
| 2022 | 0 | 3 |
| 2023 | 0 | 1 |
| 2024 | 2 | 1 |
| 2025 | 2 | 0 |
| 2026 | 1 | 0 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Quantification of sensor coverage using synthetic modeling and uses of the quantification31 Mar 2026US 12,592,024 B2Schlumberger Technology Corporation
- Qualitative or quantitative characterization of a coating surface11 Nov 2025US 12,467,874 B2Evonik Operations GmbH
- Qualitative or quantitative characterization of a coating surface21 Jan 2025US 12,203,868 B2Evonik Operations GmbH
- Processing device relating to inspection of inspection object, inspection system of inspection object, processing method relating to inspection of inspection object, and non-transitory storage medium5 Nov 2024US 12,136,238 B2Kabushiki Kaisha Toshiba
- Manufacturing monitoring assistance device, manufacturing monitoring assistance method, and manufacturing monitoring assistance program14 May 2024US 11,982,998 B2Hitachi, Ltd.
- Quantification of sensor coverage using synthetic modeling and uses of the quantification13 Jun 2024US 2024/0193849 A1Schlumberger Technology Corporation
- Processing device relating to inspection of inspection object, inspection system of inspection object, processing method relating to inspection of inspection object, and non-transitory storage medium9 Mar 2023US 2023/0071341 A1Kabushiki Kaisha Toshiba
- Qualitative or quantitative characterization of a coating surface17 Mar 2022US 2022/0082508 A1Evonik Operations GmbH
- Qualitative or quantitative characterization of a coating surface17 Mar 2022US 2022/0084181 A1Evonik Operations GmbH
- Manufacturing monitoring assistance device, manufacturing monitoring assistance method, and manufacturing monitoring assistance program24 Feb 2022US 2022/0057789 A1Hitachi, Ltd.
Most cited
By later US patents
- Resin transfer molding6US 6,856,856 B1Honeywell International Inc. · 2005
- Course of motion determination6US 8,825,438 B2Renishaw PLC · 2014
- Processing device relating to inspection of inspection object, inspection system of inspection object, processing method relating to inspection of inspection object, and non-transitory storage medium1US 12,136,238 B2Kabushiki Kaisha Toshiba · 2024