Manufacturing monitoring assistance device, manufacturing monitoring assistance method, and manufacturing monitoring assistance program

A manufacturing monitoring assistance method implemented by a manufacturing monitoring assistance device,

• the manufacturing monitoring assistance method comprising:
• causing a model creation unit of the manufacturing monitoring assistance device to create a computation model in a case where a product as a sample is normal, based on a three-dimensional form acquired from the product;
• causing a simulation unit of the manufacturing monitoring assistance device to create a corrective computation model in a case where the product is abnormal, by adding a sample of an abnormal portion in the product to the created computation model, and to perform a simulation on each of the computation model and the corrective computation model;
• and
• causing a monitoring method determination unit of the manufacturing monitoring assistance device to determine a method for monitoring a manufacturing process for the product, based on an abnormality index being a difference between an output from a sensor as a result of the simulation performed on the computation model and an output from a sensor as a result of the simulation performed on the corrective computation model, and to cause an output device to display the determined method and the abnormality index.

A non-transitory computer-readable storage medium including a manufacturing monitoring assistance program stored therein,

• the manufacturing monitoring assistance program, when executed by one or more processors included in a manufacturing monitoring assistance device, causing:
• a model creation unit of the manufacturing monitoring assistance device to execute processing of creating a computation model in a case where a product as a sample is normal, based on a three-dimensional form acquired from the product;
• a simulation unit of the manufacturing monitoring assistance device to execute processing of creating a corrective computation model in a case where the product is abnormal, by adding a sample of an abnormal portion in the product to the created computation model, and performing a simulation on each of the computation model and the corrective computation model;
• and
• a monitoring method determination unit of the manufacturing monitoring assistance device to execute processing of determining a method for monitoring a manufacturing process for the product, based on an abnormality index being a difference between an output from a sensor as a result of the simulation performed on the computation model and an output from a sensor as a result of the simulation performed on the corrective computation model, and causing an output device to display the determined method and the abnormality index.