G05B 2219/37214
Detect failed machine component, machine performance degradation
G05B2219/37214 (Detect failed machine component, machine performance degradation) appears on 18 US grants and 27 published applications in this corpus.
Search patents in G05B- Granted patents
- 18
- Published applications
- 27
- Assignees
- 23
- Inventors
- 62
- Latest grant
- 11 Nov 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2009 | 0 | 1 |
| 2010 | 0 | 0 |
| 2011 | 1 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 2 |
| 2014 | 0 | 1 |
| 2015 | 1 | 2 |
| 2016 | 0 | 0 |
| 2017 | 2 | 4 |
| 2018 | 1 | 2 |
| 2019 | 3 | 6 |
| 2020 | 1 | 1 |
| 2021 | 4 | 2 |
| 2022 | 2 | 3 |
| 2023 | 0 | 0 |
| 2024 | 2 | 1 |
| 2025 | 1 | 2 |
By publication year.
Recent patents
- Method and system for determining the dynamic response of a machine11 Nov 2025US 12,468,282 B2TRUMPF Werkzeugmaschinen GmbH + Co. KG
- Fault prediction method and fault prediction system for predecting a fault of a machine20 Aug 2024US 12,066,797 B2Fanuc Corporation
- Method for determining a status of one of multiple machine components of a machine and status-determining system9 Jan 2024US 11,869,278 B2Lenze Automation GmbH
- Evaluation apparatus, evaluation system, and evaluation method4 Oct 2022US 11,460,818 B2Yokogawa Electric Corporation
- Machine learning Method and machine learning device for learning fault conditions, and fault prediction device and fault prediction system including the machine learning device15 Mar 2022US 11,275,345 B2Fanuc Corporation
- Machine monitoring system10 Apr 2025US 2025/0116988 A1Emerson Process Management Chennai Private Limited
- Information processing apparatus, information processing method, and semiconductor manufacturing system6 Mar 2025US 2025/0076843 A1Tokyo Electron Limited
- Failure diagnosis apparatus, failure diagnosis method, and non-transitory computer readable medium10 Oct 2024US 2024/0337399 A1Mitsubishi Electric Corporation
- Method and system for determining the dynamic response of a machine29 Sep 2022US 2022/0308551 A1TRUMPF Werkzeugmaschinen GmbH + Co. KG
- Monitoring apparatus for the identification of anomalies and degradation paths in a machine tool11 Aug 2022US 2022/0253037 A1Machining Centers Manufacturing S.P.A. Oppure Mcm S.P.A.
Most cited
By later US patents
- Baler machine monitoring and performance interfaces, systems and methods13US 8,046,192 B2Smurfit-Stone Container Enterprises, Inc. · 2011
- Robot system controlling method, program, recording medium, robot system, and diagnosis apparatus8US 10,363,660 B2Canon Kabushiki Kaisha · 2019
- Machine learning method and machine learning device for learning fault conditions, and fault prediction device and fault prediction system including the machine learning device7US 10,317,853 B2Fanuc Corporation · 2019
- Component mounting system and error stoppage diagnosis method for component mounting device5US 10,477,751 B2Fuji Corporation · 2019
- Parallel link robot, parallel link robot system, and method of controlling parallel link robot5US 8,948,915 B2Kabushiki Kaisha Yaskawa Denki · 2015